Issue Description:
If master is in HD mode, if it sends data without receiving data,
it will still enable the RX DMA because of old version ESP32 silicon issue.
And because there is no correctly linked RX DMA descriptor,
an inlink_dscr_error intr will be seen, which will influence the following RX transactions.
This issue is only found on ESP32.
There is no ccomp timer on C3, which means our performance tests will start
failing again due to variance caused by cache misses.
This MR adds TEST_PERFORMANCE_CCOMP_ macro that will only fail
performance test if CCOMP timer is supported on the target
During HAL layer refactoring and new chip bringup, we have several
caps.h for each part, to reduce the conflicts to minimum. But this is
The capabilities headers will be relataive stable once completely
written (maybe after the featues are supported by drivers).
Now ESP32 and ESP32-S2 drivers are relative stable, making it a good
time to combine all these caps.h into one soc_caps.h
This cleanup also move HAL config and pin config into separated files,
to make the responsibilities of these headers more clear. This is
helpful for the stabilities of soc_caps.h because we want to make it
public some day.
heap: ported tlsf allocator into multi heap
heap_host_tests: added tlsf allocator into host test
heap_host_test: update freebytes after using free
heap_tests: tlsf now passing on host tests without poisoning
multi_heap: added support for memalign using tlsf implementation
heap_caps: removed heap_caps_aligned_free
heap/test: fixed broken aligned alloc test build
heap: added poisoning pattern when blocks are being merged
heap/tests: added timing tests for memory allocation
heap: reduced tlsf structure overhead
heap/tlsf: made all short functions inside of tlsf module as inline to improve timings
heap: moved tlsf heap routines outside of flash memory
newlib: linked multiheap memalign with newlib memalign function
heap: moved block member functions to a separate file so multi_heap can use the functions
heap/test: improved the tlsf timing test
heap/test: added memalign on aligned alloc tests
heap: moved tlsf configuration constants to a separated file
heap: added random allocations test with timings
heap: modified the calculation of heap free bytes
heap: make aligned free true deprecated functions and update their documentation
heap: add extra assert after successive mallocs on small allocation host test
heap: remove legacy aligned alloc implementation.
performance: added malloc and free time performance default values
* changing dependencies from unity->cmock
* added component.mk and Makefile.projbuild
* ignore test dir in gen_esp_err_to_name.py
* added some brief introduction of CMock in IDF
ESP32 lets the user choose from using Vref, Lookup Table, and Two-Point Calibration. In ESP32S2 only two-point calibration is supported. This commit support these changes in idf.
Closes https://github.com/espressif/esp-idf/issues/5455
Previously both tasks had equal priority, possible for write task and another
internal task to be scheduled at the same time - starving read task and
causing data loss.
Related to IDFCI-59
The tests used to measure the throughput by FreeRTOS
`xTaskGetTickCount()`. The rounding error can be quite big, compared to
total measurement time (1350 ms for 4-bit mode).
This commit use `esp_timer_get_time()` instead to measure typical time,
which is in microseconds. Moreover, to get rid of the time error from
cache miss, `ccomp_timer_*` are used to get the cache compensated time
to measure the throughput used for unit test performance assertion.
The SPI bus lock on SPI1 introduces two side effects:
1. The device lock for the main flash requires the
`CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION` to be selected, however this
option is disabled by default in earlier IDF versions. Some developers
may find their project cannot be built by their old sdkconfig files.
2. Usually we don't need the lock on the SPI1 bus, due to it's
restrictions. However the overhead still exists in this case, the IRAM
cost for static version of semaphore functions, and the time cost when
getting and releasing the lock.
This commit:
1. Add a CONFIG_SPI_FLASH_BYPASS_MAIN_LOCK option, which will forbid the
space cost, as well as the initialization of the main bus lock.
2. When the option is not selected, the bus lock is used, the
`CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION` will be selected explicitly.
3. Revert default value of `CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION`
to `n`.
introduced in 49a48644e4.
Closes https://github.com/espressif/esp-idf/issues/5046
* Add test support for ESP32S2
* Add loop back test
* Support chip internal connection, no external wiring required.
* Delete the relevant codes of PDM of ESP32-S2 ll layer.
* fix dac dma mode issue
* Let `[ignore] case` return to freedom
1) Because this test uses its own ISR, we need to release it with `esp_intr_free` instead of `pcnt_isr_service_uninstall`.
2) `pcnt_evt_queue` needs to be created before the interrupt is registered and needs to be released at the end of each case.
* Add test support for ESP32S2
* Support chip internal connection, no external wiring required.
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.
* Modify the function implementation of ESP32-S2 RTC GPIO
On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
The test case may run after an RTC_WDT_RESET (if we are on rev. 0
ESP32), or software reset (when running test cases locally).
Also moving the test case next to the other timer group driver tests.
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .
Cleaned up header files from unnecessary headers (releated to soc/... headers).
This MR removes the common dependency from every IDF components to the SOC component.
Currently, in the ``idf_functions.cmake`` script, we include the header path of SOC component by default for all components.
But for better code organization (or maybe also benifits to the compiling speed), we may remove the dependency to SOC components for most components except the driver and kernel related components.
In CMAKE, we have two kinds of header visibilities (set by include path visibility):
(Assume component A --(depends on)--> B, B is the current component)
1. public (``COMPONENT_ADD_INCLUDEDIRS``): means this path is visible to other depending components (A) (visible to A and B)
2. private (``COMPONENT_PRIV_INCLUDEDIRS``): means this path is only visible to source files inside the component (visible to B only)
and we have two kinds of depending ways:
(Assume component A --(depends on)--> B --(depends on)--> C, B is the current component)
1. public (```COMPONENT_REQUIRES```): means B can access to public include path of C. All other components rely on you (A) will also be available for the public headers. (visible to A, B)
2. private (``COMPONENT_PRIV_REQUIRES``): means B can access to public include path of C, but don't propagate this relation to other components (A). (visible to B)
1. remove the common requirement in ``idf_functions.cmake``, this makes the SOC components invisible to all other components by default.
2. if a component (for example, DRIVER) really needs the dependency to SOC, add a private dependency to SOC for it.
3. some other components that don't really depends on the SOC may still meet some errors saying "can't find header soc/...", this is because it's depended component (DRIVER) incorrectly include the header of SOC in its public headers. Moving all this kind of #include into source files, or private headers
4. Fix the include requirements for some file which miss sufficient #include directives. (Previously they include some headers by the long long long header include link)
This is a breaking change. Previous code may depends on the long include chain.
You may need to include the following headers for some files after this commit:
- soc/soc.h
- soc/soc_memory_layout.h
- driver/gpio.h
- esp_sleep.h
The major broken include chain includes:
1. esp_system.h no longer includes esp_sleep.h. The latter includes driver/gpio.h and driver/touch_pad.h.
2. ets_sys.h no longer includes soc/soc.h
3. freertos/portmacro.h no longer includes soc/soc_memory_layout.h
some peripheral headers no longer includes their hw related headers, e.g. rom/gpio.h no longer includes soc/gpio_pins.h and soc/gpio_reg.h
BREAKING CHANGE
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
The requirements of pin capabilites is different for spi master and
slave. The master needs CS, SCLK, MOSI to be output-able, while slave
needs MISO to be output-able.
Previous code is for master only.
This commit allows to place other 3 pins than MISO on input-only pins
for slaves. Refactoring for spi_common is also included.
Resolves https://github.com/espressif/esp-idf/issues/2455
New unit tests added
------------------------
**Local:** Local test uses the GPIO matrix to connect the master and the
slave on the same board. When the master needs the iomux, the master
uses the GPIOs of its own, the slave connect to the pins by GPIO matrix;
When the slave needs the iomux, the slave uses the GPIOs of its own, the
master connects to the pins by GPIO matrix.
- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.
**M & S**: Master & slave tests performs the test with two boards. The
master and slave use iomux or gpio matrix according to the config.
- Provide a new unit test which performs freq scanning in mode 0. It
scans frequency of 1M, 8M, 9M and all frequency steps up to the maximum
frequency allowed.
- Provide a new unit test which performs mode test with significant
frequencies. It tests mode 0,1,2,3 with low frequency, and the maximum
frequency allowed.
