esp-idf/components/driver/test
2020-10-20 21:06:09 +08:00
..
adc_dma_test adc_test: fix the failure caused by low expected middle value 2020-10-18 10:32:04 +08:00
dac_dma_test bugfix(adc): missing ranges of ADC codes in ESP32 2020-10-12 07:41:03 +00:00
include/test dfiver(dac): add dac dma driver and unit test 2020-08-26 06:23:24 +00:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
CMakeLists.txt cmock: added cmock as component 2020-09-02 16:38:37 +08:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_adc_common.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_common_spi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_dac.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_dedicated_gpio.c dedicated gpio: add driver 2020-10-20 21:06:09 +08:00
test_gpio.c driver test: Don't use ESP32-S2 CS1 pin for output test 2020-10-14 16:18:55 +11:00
test_i2c.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_i2s.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_ledc.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_pcnt.c pcnt: replace isr register with isr service in example 2020-10-19 11:56:18 +08:00
test_pwm.c soc: updates caps usage 2020-10-17 16:10:17 +08:00
test_rmt.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rs485.c Bugfix/fix RS485 ut fail 2020-10-19 16:17:19 +08:00
test_rtcio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_sdio.c soc: updates caps usage 2020-10-17 16:10:17 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_bus_lock.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_master.c tests: re-add all disabled tests and all disabled configurations 2020-10-14 16:11:49 +11:00
test_spi_param.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_sio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave_hd.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_timer.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_uart.c driver: add diagnostic information into UART test, enable flow control 2020-10-02 17:33:35 +02:00