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647dea9395
esp-idf/components/driver/test
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Michael (XIAO Xufeng) 647dea9395 soc: combine xxx_caps.h into one soc_caps.h 
During HAL layer refactoring and new chip bringup, we have several
caps.h for each part, to reduce the conflicts to minimum. But this is
The capabilities headers will be relataive stable once completely
written (maybe after the featues are supported by drivers).

Now ESP32 and ESP32-S2 drivers are relative stable, making it a good
time to combine all these caps.h into one soc_caps.h

This cleanup also move HAL config and pin config into separated files,
to make the responsibilities of these headers more clear. This is
helpful for the stabilities of soc_caps.h because we want to make it
public some day.
2020-10-17 16:10:15 +08:00
..
adc_dma_test bugfix(adc): missing ranges of ADC codes in ESP32 2020-10-12 07:41:03 +00:00
dac_dma_test bugfix(adc): missing ranges of ADC codes in ESP32 2020-10-12 07:41:03 +00:00
include/test dfiver(dac): add dac dma driver and unit test 2020-08-26 06:23:24 +00:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
CMakeLists.txt cmock: added cmock as component 2020-09-02 16:38:37 +08:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_adc_common.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_common_spi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_dac.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_gpio.c driver test: Don't use ESP32-S2 CS1 pin for output test 2020-10-14 16:18:55 +11:00
test_i2c.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_i2s.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_ledc.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_pcnt.c soc: combine xxx_caps.h into one soc_caps.h 2020-10-17 16:10:15 +08:00
test_pwm.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rmt.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rs485.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rtcio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_sdio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_bus_lock.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_master.c tests: re-add all disabled tests and all disabled configurations 2020-10-14 16:11:49 +11:00
test_spi_param.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_sio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave_hd.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_timer.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_uart.c driver: add diagnostic information into UART test, enable flow control 2020-10-02 17:33:35 +02:00