Ivan Grokhotkov bb4f5617ab test: clean up "leaks" tags from most unit tests

2019-04-16 20:07:40 +08:00

..

include/test

spi: add new test for timing and mode

2019-01-26 00:10:41 +08:00

param_test

test: add new test framework for different configurations

2019-01-26 00:10:41 +08:00

CMakeLists.txt

test: add new test framework for different configurations

2019-01-26 00:10:41 +08:00

component.mk

test: add new test framework for different configurations

2019-01-26 00:10:41 +08:00

test_adc2.c

unit tests: Only initialise tcpip_adapter() when needed by the test

2018-10-17 22:53:46 +00:00

test_common_spi.c

spi_master: refactor and add HAL support

2019-03-28 17:14:50 +08:00

test_gpio.c

separate rom from esp32 component to esp_rom

2019-03-21 18:51:45 +08:00

test_i2c.c

test: Fix some unused identifier warnings

2018-12-10 12:34:16 +08:00

test_i2s.c

test: components/driver: i2s case

2018-11-29 11:32:40 +08:00

test_ledc.c

separate rom from esp32 component to esp_rom

2019-03-21 18:51:45 +08:00

test_pcnt.c

separate rom from esp32 component to esp_rom

2019-03-21 18:51:45 +08:00

test_pwm.c

separate rom from esp32 component to esp_rom

2019-03-21 18:51:45 +08:00

test_rmt.c

rmt test: add the case for bug in github[#1815]

2018-09-06 19:43:30 +08:00

test_sdmmc_sdspi_init.cpp

sdmmc, sdspi: fix initializers to be C++-compatible, add test

2018-04-23 14:35:13 +08:00

test_sigmadelta.c

test: driver/sigmadelta test case

2018-06-13 10:15:06 +08:00

test_spi_master.c

spi_master: refactor and add HAL support

2019-03-28 17:14:50 +08:00

test_spi_param.c

Merge branch 'test/spi_sio_test' into 'master'

2019-03-13 15:15:43 +08:00

test_spi_sio.c

separate rom from esp32 component to esp_rom

2019-03-21 18:51:45 +08:00

test_spi_slave.c

test: change spi test host to macros

2019-01-30 20:57:25 +08:00

test_timer.c

test: components/driver: timer case

2018-06-13 01:39:07 +00:00

test_uart.c

test: clean up "leaks" tags from most unit tests

2019-04-16 20:07:40 +08:00