esp-idf/components/driver/test
Felipe Neves bd9b921713 heap_tlsf: added implementation of TLSF allocator
heap: ported tlsf allocator into multi heap

heap_host_tests: added tlsf allocator into host test

heap_host_test: update freebytes after using free

heap_tests: tlsf now passing on host tests without poisoning

multi_heap: added support for memalign using tlsf implementation

heap_caps: removed heap_caps_aligned_free

heap/test: fixed broken aligned alloc test build

heap: added poisoning pattern when blocks are being merged

heap/tests: added timing tests for memory allocation

heap: reduced tlsf structure overhead

heap/tlsf: made all short functions inside of tlsf  module as inline to improve timings

heap: moved tlsf heap routines outside of flash memory

newlib: linked multiheap memalign with newlib memalign function

heap: moved block member functions to a separate file so multi_heap can use the functions

heap/test: improved the tlsf timing test

heap/test: added memalign on aligned alloc tests

heap: moved tlsf configuration constants to a separated file

heap: added random allocations test with timings

heap: modified the calculation of heap free bytes

heap: make aligned free true deprecated functions and update their documentation

heap: add extra assert after successive mallocs on small allocation host test

heap: remove legacy aligned alloc implementation.

performance: added malloc and free time performance default values
2020-10-13 23:52:03 +00:00
..
adc_dma_test global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
dac_dma_test global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
include/test dfiver(dac): add dac dma driver and unit test 2020-08-26 06:23:24 +00:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
CMakeLists.txt cmock: added cmock as component 2020-09-02 16:38:37 +08:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_adc_common.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_common_spi.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_dac.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_gpio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_i2c.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_i2s.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_ledc.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_pcnt.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_pwm.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rmt.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rs485.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_rtcio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_sdio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_bus_lock.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_master.c heap_tlsf: added implementation of TLSF allocator 2020-10-13 23:52:03 +00:00
test_spi_param.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_sio.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave_hd.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_spi_slave.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_timer.c global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
test_uart.c driver: add diagnostic information into UART test, enable flow control 2020-10-02 17:33:35 +02:00