There is no ccomp timer on C3, which means our performance tests will start
failing again due to variance caused by cache misses.
This MR adds TEST_PERFORMANCE_CCOMP_ macro that will only fail
performance test if CCOMP timer is supported on the target
From now on, we have two tags for esp_flash tests:
- [esp_flash] for main flash chip only tests
- [esp_flash_3] for tests with external flash chips
To Run all tests, type `[esp_flash`; to run tests for main flash chip
only, type `[esp_flash].
* changing dependencies from unity->cmock
* added component.mk and Makefile.projbuild
* ignore test dir in gen_esp_err_to_name.py
* added some brief introduction of CMock in IDF
The issue is introduced in 571864e8ae. The
esp_flash API tries to clear the QE bit when the flash is not working in
quad modes.
However this introduces a regression, compared to earlier versions and
the legacy API. When the chip is not detected, the generic chip driver
is used, which cannot 100% handle the QE bit properly for all flash
vendors. There may be some flash chips (e.g. MXIC) that can be used in
dual modes by legacy API, but output wrong data when the esp_flash API
clears the QE bit in a wrong way.
This commit reverts the QE force clearing behavior, so that it's safer
for the generic chip driver to work under dual modes.
Allocation of the temporary internal buffer will now repeat until a small enough buffer can be
allocated, and only fail if less than a 256 byte block of internal RAM is free.
Adds unit test for the same, and generic test utility for creating memory pressure.
Previously would try allocate buffer of minimum size 16KB not maximum size 16KB, causing
out of memory errors for any large reads, or if less than 16KB contiguous free heap.
Also, if using legacy API and internal allocation failed then implementation would abort()
instead of returning the error to the caller.
Added test for using large buffers in PSRAM.
Closes https://github.com/espressif/esp-idf/issues/4769
Also reported on forum: https://esp32.com/viewtopic.php?f=13&t=14304&p=55972
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.
The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.
This commit:
1. Cancel the dummy phase
2. Set and clear the QE bit according to chip settings, allowing tests
for QE bits. However for some chips (Winbond for example), it's not
forced to clear the QE bit if not able to.
3. Also refactor to allow chip_generic and other chips to share the same
code to read and write qe bit; let common command and read command share
configure_host_io_mode.
4. Rename read mode to io mode since maybe we will write data with quad
mode one day.
Add support for get write protection support, fixed the duplicated
set_write_protection link.
All the write_protection check in the top layer are removed. The lower
levels (chip) should ensure to disable write protection before the
operation start.
Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .
Cleaned up header files from unnecessary headers (releated to soc/... headers).
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
New unity component can be used for testing other applications.
Upstream version of Unity is included as a submodule.
Utilities specific to ESP-IDF unit tests (partitions, leak checking
setup/teardown functions, etc) are kept only in unit-test-app.
Kconfig options are added to allow disabling certain Unity features.
The fix is for the situation when cache disabling mechanism causes
a deadlock with user tasks. Situation is as follows:
1. spi_flash operation is started from low-priority task on CPU0
2. It uses IPC to wake up high-priority IPC1 task on CPU1, preventing
all other tasks on CPU1 from running. This is needed to safely
disable the cache.
3. While the task which started spi_flash operation is waiting for IPC1
task to acknowledge that CPU1 is not using cache anymore, it is
preempted by a higher priority application task ("app0").
4. Task app0 busy-waits for some operation on CPU1 to complete. But
since application tasks are blocked out by IPC1 task, this never
happens. Since app0 is busy-waiting, the task doing spi flash
operation never runs.
The more or less logical soltion to the problem would be to also do
cache disabling on CPU0 and the SPI flash operation itself from IPC0
task. However IPC0 task stack would need to be increased to allow doing
SPI flash operation (and IPC1 stack as well). This would waste some
memory. An alternative approach adopted in this fix is to call FreeRTOS
functions to temporary increase the priority of SPI flash operation task
to the same level as the IPC task.
Fixes https://github.com/espressif/arduino-esp32/issues/740
Fixes https://github.com/espressif/esp-idf/issues/1157
* Writing >4 bytes to unaligned offsets would fail
* Writiing data from flash would fail (wrong buffer was used)
* Writing >8192 bytes from RAM would over-write data multiple times
Adds test cases for the above.
1) fixed SPI_read_status: added check for flash busy flag in matrix mode
2) fixed SPI_page_program: enable write before writing data to SPI FIFO
3) SPI flash ROM funcs replacement is controlled via menuconfig option
Flash operation complete flag was cleared by the core initiating flash
operation. If the other core was running an ISR, then IPC task could
be late to enter the loop to check s_flash_op_complete by the time next
flash operation started. If the flag is cleared on the CPU waiting on
this flag, then the race condition can not happen.
* Erase range operations allow preemption after each block or sector.
* Write operations allow preemption every 8KB of data.
* Reado operations allow preemption every 16KB of data.
The issue that cache entries are not invalidated correctly sometimes
can also be reproduced for non-encrypted flash as well.
This change updates the workaround to do Cache_Flush, enabling it for
non-encrypted flash, and adds a unit test.
Partition/SPI/OTA docs & OTA new functionality
* Update partition, SPI flash & OTA docs to reflect functionality changes
* Refactor OTA implementation to perform checks mentioned in API doc
* Add new functions to OTA API: esp_ota_get_running_partition() & esp_ota_get_next_update_partition() functions
* Add spi_flash_cache2phys() & spi_flash_phys2cache() functions to support esp_ota_get_running_partition()
See merge request !513
MR !441 (7c155ab) has fixed issue with esp_intr_noniram_{disable,enable}
calls not being properly protected by spi_flash_op_{lock,unlock}.
Unit test was added, but the unit test environment tests only dual-core
config. Similar issue was present in the code path for the single-core
config, where esp_intr_noniram_{disable,enable} calls were unprotected.
This change fixes the protection issue and updates the unit test to
run properly in single core config as well.
The issue with running unit tests for single core config will be
addressed in a separate MR.
Without this, it's possible for stale information to be read from
cache via mmap, even if the MMU table entry had been invalidated
prior to writing flash (if the same MMU table entry was re-used after
writing flash.)
