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1e1d50376b
esp-idf/components/spi_flash/test
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Michael (XIAO Xufeng) 1e1d50376b esp_flash: add unit test for external flash and QE toggling 
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
2019-10-14 17:25:58 +08:00
..
CMakeLists.txt components: use new component registration api 2019-06-21 19:53:29 +08:00
component.mk add unit tests to esp-idf 2016-11-22 14:45:50 +08:00
test_cache_disabled.c spi_flash: support working on differnt buses and frequency 2019-06-18 06:32:52 +00:00
test_esp_flash.c esp_flash: add unit test for external flash and QE toggling 2019-10-14 17:25:58 +08:00
test_flash_encryption.c esp_flash: add support for encrypted read and write 2019-09-12 12:41:50 +08:00
test_large_flash_writes.c spi_flash: support working on differnt buses and frequency 2019-06-18 06:32:52 +00:00
test_mmap.c spi_flash: remove duplicate definition of spi_flash_unlock 2019-08-23 12:37:55 +08:00
test_out_of_bounds_write.c spi_flash: support working on differnt buses and frequency 2019-06-18 06:32:52 +00:00
test_partition_ext.c spi_flash: support for partitions in external flash 2019-07-02 10:26:06 +02:00
test_partitions.c spi_flash: support working on differnt buses and frequency 2019-06-18 06:32:52 +00:00
test_read_write.c tools: Mass fixing of empty prototypes (for -Wstrict-prototypes) 2019-08-01 16:28:56 +07:00
test_spi_flash.c timer_group: use the LL 2019-08-09 13:46:31 +08:00