gaoxu
|
d57c4cde44
|
ci(adc): increase adc performance test threshold on c6
|
2023-09-28 09:18:58 +00:00 |
|
laokaiyao
|
9811ff7be9
|
ci(adc): increase all adc performance test threshold on c6
|
2023-09-20 11:35:25 +08:00 |
|
laokaiyao
|
f781bf1c5c
|
ci(adc): increase adc performance test threshold on c6
|
2023-09-18 10:22:11 +08:00 |
|
laokaiyao
|
ffb40a89d9
|
adc_cali: supported channel compensation of adc calibration on esp32c6
|
2023-05-23 22:44:25 +08:00 |
|
wanlei
|
d8ac58b4d4
|
spi: add high freq test on different spi config
|
2023-02-27 11:27:57 +08:00 |
|
Armando
|
d0e4d36fb6
|
esp_adc: support h2 oneshot mode and continuous mode
|
2023-02-23 11:48:31 +08:00 |
|
Marius Vikhammer
|
f9c1a2b791
|
Merge branch 'feature/core_c6_component_tests' into 'master'
ci: update idf-core related tests for C6
Closes IDF-6888
See merge request espressif/esp-idf!22282
|
2023-02-14 16:47:52 +08:00 |
|
Armando
|
790be9390a
|
esp_adc: increase c6 adc std thres
c6, h2, hardware calibration not supported. Reading result varies.
|
2023-02-14 10:18:34 +08:00 |
|
Marius Vikhammer
|
25abc7f6d8
|
ci: update idf-core related tests for C6
|
2023-02-13 13:01:57 +08:00 |
|
Armando
|
3afa671069
|
esp_adc: added adc digital filter feature
|
2023-02-10 16:46:20 +00:00 |
|
wanlei
|
b20c156ae6
|
spi_master: update spi performance test resulte for C6
|
2023-01-18 10:41:43 +08:00 |
|
wanlei
|
3aeedc2ad3
|
spi: bringup c6 spi master & slave driver support
|
2022-11-18 15:54:14 +08:00 |
|
Sachin Parekh
|
69c8df5e49
|
esp32c6: Add support for ECC peripheral
|
2022-11-07 10:42:33 +05:30 |
|
Song Ruo Jing
|
2557e24a28
|
ci: Enable esp32c6 example, test_apps, and unit tests CI build stage
|
2022-11-01 11:23:21 +08:00 |
|