alex/esp-idf
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e91c7bcc3a
esp-idf/components/driver/test/esp32
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xiongyu af4c455417 bugfix(gpio):fix esp32 s2 rtc io issue 
* Modify the function implementation of ESP32-S2 RTC GPIO
  On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
  On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
2019-11-27 17:18:20 +08:00
..
test_adc2.c examples: modify other examples and tests to use esp_netif instead of tcpip_adapter 2019-11-13 12:36:25 +01:00
test_gpio.c bugfix(gpio):fix esp32 s2 rtc io issue 2019-11-27 17:18:20 +08:00
test_i2c.c bugfic(i2c): fix i2c driver ut issue. 2019-11-25 07:03:02 +00:00
test_i2s.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_pcnt.c fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
test_pwm.c mcpwm: add HAL layer support 2019-11-25 00:36:30 +08:00
test_rmt.c rmt: add HAL layer 2019-11-20 10:54:21 +08:00
test_rs485.c ci: disable UTs for esp32s2beta without runners 2019-09-04 10:53:25 +10:00
test_spi_master.c Merge branch 'master' into feature/esp32s2beta_merge 2019-10-15 14:59:27 +11:00
test_spi_param.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_spi_sio.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
test_spi_slave.c ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00