alex/esp-idf
alex/esp-idf
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e91c7bcc3a
esp-idf/components/driver/test
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xiongyu af4c455417 bugfix(gpio):fix esp32 s2 rtc io issue 
* Modify the function implementation of ESP32-S2 RTC GPIO
  On ESP32 those PADs which have RTC functions must set pullup/down/capability via RTC register.
  On ESP32-S2, Digital IOs have their own registers to control pullup/down/capability, independent with RTC registers.
* Add ESP32-S2 support of unit test
* Modify the pull-up test of unit test
* Modify the interrupt test of unit test
* Modify input and output mode test of unit test
2019-11-27 17:18:20 +08:00
..
esp32 bugfix(gpio):fix esp32 s2 rtc io issue 2019-11-27 17:18:20 +08:00
include/test fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
param_test Fix remaining -Wstrict-prototypes warnings 2019-08-01 16:28:56 +07:00
CMakeLists.txt fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
component.mk fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
test_common_spi.c global: move the soc component out of the common list 2019-04-16 13:21:15 +08:00
test_i2c.c feature(I2C): Add i2c hal support. 2019-11-21 20:34:07 +08:00
test_ledc.c bugfix(LEDC):fix ledc CI issue for esp32s2beta. 2019-11-14 12:20:29 +08:00
test_rtcio.c rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
test_sdmmc_sdspi_init.cpp fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
test_sigmadelta.c test: driver/sigmadelta test case 2018-06-13 10:15:06 +08:00
test_timer.c driver/timer: fix software reset UT (again) 2019-11-24 21:10:50 +01:00
test_uart.c feature: Add uart hal support. 2019-11-26 20:01:50 +08:00