esp-idf/components/driver/test_apps
Song Ruo Jing c55a07bf57 refactor(uart): add support to be able to test LP_UART port
Increase LP_UART_EMPTY_THRESH_DEFAULT value to 4. The original value
could cause the FIFO become empty before filling next data into the FIFO
when the buadrate is high. TX_DONE interrupt would raise before actual
transmission complete in such case.
2024-04-15 19:39:30 +08:00
..
analog_comparator feat(ana_cmpr): supported etm in analog comparator example 2023-09-25 19:57:34 +08:00
components feat(spi_master): p4 enable test and examples 2023-10-08 14:45:52 +08:00
dac_test_apps fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12 2023-11-07 14:11:10 +08:00
gpio feat(lp_io): Add support for ESP32P4 2023-09-20 19:39:41 +08:00
gpio_extensions ci: add pd_vddsdio in lightsleep UT tests 2023-07-14 21:21:23 +08:00
gptimer feat(mcpwm): Set group clock prescale dynamically 2023-09-08 11:57:29 +08:00
i2c_test_apps fix(i2c_slave): Fix bugs on i2c slave, 2024-04-07 15:17:48 +08:00
i2s_test_apps fix(i2s): multi_dev test update to use non_boot_ctrl gpio 2024-01-25 16:44:58 +08:00
ledc feat(ledc): support ledc on esp32p4 2023-10-17 16:40:04 +08:00
legacy_adc_driver Merge branch 'feature/support_adc_calibration_on_h2_v5.2' into 'release/v5.2' 2023-11-09 12:14:40 +08:00
legacy_i2c_driver fix(i2c): test app change gpio 2024-01-16 11:10:36 +08:00
legacy_mcpwm_driver feat(ci): Enable p4 example, test_apps and unit tests CI build 2023-08-24 12:51:19 +08:00
legacy_pcnt_driver feat(ledc): support ledc on esp32p4 2023-10-17 16:40:04 +08:00
legacy_rmt_driver feat(rmt): add driver support for esp32p4 2023-09-19 12:54:14 +08:00
legacy_rtc_temp_driver driver:Trim the build components 2023-06-13 14:24:44 +08:00
legacy_timer_driver feat(ci): Enable p4 example, test_apps and unit tests CI build 2023-08-24 12:51:19 +08:00
mcpwm fix(mcpwm): fault trigger test forget connect timer and operator 2023-11-17 16:34:40 +08:00
parlio feat(parlio_tx): supported parlio tx on p4 2023-09-25 10:42:30 +08:00
pulse_cnt feat(ci): Enable p4 example, test_apps and unit tests CI build 2023-08-24 12:51:19 +08:00
rmt fix(rmt): fix the counting clock used by rx filter on esp32/s2 2024-04-08 11:16:18 +08:00
rs485 driver:Trim the build components 2023-06-13 14:24:44 +08:00
sdio Merge branch 'feature/cleanup_wrong_log_use' into 'master' 2023-06-15 21:49:49 +08:00
spi feat(spi_master): p4 enable test and examples 2023-10-08 14:45:52 +08:00
temperature_sensor fix(temperature_sensor): Fix the value is incorrect if disable and enable again 2024-02-21 11:58:22 +08:00
touch_sensor_v1 driver:Trim the build components 2023-06-13 14:24:44 +08:00
touch_sensor_v2 Merge branch 'feature/cleanup_wrong_log_use' into 'master' 2023-06-15 21:49:49 +08:00
twai feat(twai): support multiple twai controllers 2023-10-12 09:59:27 +08:00
uart refactor(uart): add support to be able to test LP_UART port 2024-04-15 19:39:30 +08:00
usb_serial_jtag feat(usb_serial_jtag): Add pytest for usb_serial_jtag 2023-10-10 10:05:46 +08:00
.build-test-rules.yml Merge branch 'bugfix/compile_usj_fail_c6' into 'master' 2023-10-10 13:47:19 +08:00