alex/esp-idf
alex/esp-idf
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Code Issues Actions 2 Packages Projects Releases Wiki Activity
15,038 Commits 20 Branches 148 Tags 384 MiB
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14 Commits

Author SHA1 Message Date
Angus Gratton
ba3a6f68b4 driver test: Don't use ESP32-S2 CS1 pin for output test 
On a ESP32-S2 with PSRAM attached, this may cause a crash
 2020-10-14 16:18:55 +11:00
morris
9fa06719fa global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
morris
2917651478 esp_rom: extract common ets apis into esp_rom_sys.h 2020-07-27 15:27:01 +08:00
morris
345606e7f3 esp_rom: extract common uart apis into esp_rom_uart.h 2020-07-17 16:00:59 +08:00
morris
a4d0033c03 esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
michael
f1a4c84e57 GPIO: fix unit test issue on ESP32-S2 
Also rename some test variables.
 2020-02-26 11:12:09 +08:00
morris
e30cd361a8 global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
michael
4220752aed ut: Move tests back from "esp32" subfolder 
DISABLED_FOR_TARGETS macros are used

Partly revert "ci: disable unavailable tests for esp32s2beta"

This partly reverts commit 76a3a5fb48.

Partly revert "ci: disable UTs for esp32s2beta without runners"

This partly reverts commit eb158e9a22.

Partly revert "fix unit test and examples for s2beta"

This partly reverts commit 9baa7826be.

Partly revert "efuse: Add support for esp32s2beta"

This partly reverts commit db84ba868c.
 2020-01-06 17:13:53 +08:00
Michael (XIAO Xufeng)
9baa7826be fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
kooho
64f81aefae bugfix(GPIO): Fixed the bug that GPIO enables interrupts on one core, 
but registers interrupt service routines on another core

closes https://github.com/espressif/esp-idf/issues/2808
closes https://github.com/espressif/esp-idf/issues/2845
 2019-07-29 11:09:07 +00:00
morris
c159984264 separate rom from esp32 component to esp_rom 
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
 2019-03-21 18:51:45 +08:00
houchenyao
98c868ff09 gpio test: add GPIO multi-level interrupt test 
add case to test the bug of v3.0. If we trigger the level interrupt more than once, will cause the interrupt be triggered many times
 2018-09-06 17:43:23 +08:00
hou wen xiang
5402ace528 driver(gpio) : Fixed the gpio related bug for release v3.1. 2018-07-12 20:19:02 +08:00
houchenyao
e5717e365f test: add driver/gpio test case 2018-06-12 19:04:30 +08:00