When using DPort to read fifo, fifo_cnt is not credible, we need to calculate the real cnt based on the fifo read and write pointer. When using AHB to read FIFO, we can use fifo_cnt to indicate the data length in fifo.
The tests used to measure the throughput by FreeRTOS
`xTaskGetTickCount()`. The rounding error can be quite big, compared to
total measurement time (1350 ms for 4-bit mode).
This commit use `esp_timer_get_time()` instead to measure typical time,
which is in microseconds. Moreover, to get rid of the time error from
cache miss, `ccomp_timer_*` are used to get the cache compensated time
to measure the throughput used for unit test performance assertion.
The log in the spi_bus_lock_touch may be annoying. This commit suppress
the log level, and make the log visible only when the device altered.
Resolves https://github.com/espressif/esp-idf/issues/5056
The SPI bus lock on SPI1 introduces two side effects:
1. The device lock for the main flash requires the
`CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION` to be selected, however this
option is disabled by default in earlier IDF versions. Some developers
may find their project cannot be built by their old sdkconfig files.
2. Usually we don't need the lock on the SPI1 bus, due to it's
restrictions. However the overhead still exists in this case, the IRAM
cost for static version of semaphore functions, and the time cost when
getting and releasing the lock.
This commit:
1. Add a CONFIG_SPI_FLASH_BYPASS_MAIN_LOCK option, which will forbid the
space cost, as well as the initialization of the main bus lock.
2. When the option is not selected, the bus lock is used, the
`CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION` will be selected explicitly.
3. Revert default value of `CONFIG_FREERTOS_SUPPORT_STATIC_ALLOCATION`
to `n`.
introduced in 49a48644e4.
Closes https://github.com/espressif/esp-idf/issues/5046
When CONFIG_LOG_DEFAULT_LEVEL is verbose, the ESP_(EARLY_)LOGx will try
to print with format string and tag out of the DRAM while the cache is
disabled. This commit puts the TAG into DRAM, and uses the
'ESP_DRAM_LOGx` to fix the cache miss bug.
Also fixes a LoadProhibited issue when last_dev is NULL.
check master read write functions with array of registers)
fix master serial processing code and modbus controller to work with register array
modbus_master: add reading and writing of test value array (58 registers) to check failure is gone
remove parameter temporary buffer from modbus controller to allow more than 24 byte writes
driver: fix issue with TOUT feature
driver: fix uart_rx_timeout issue
driver: fix issue with rxfifo_tout_int_raw not triggered when received fifo_len = 120 byte and all bytes read out of fifo as result of rxfifo_full_int_raw
driver: add function uart_internal_set_always_rx_timeout() to always handle tout interrupt
examples: call uart_internal_set_always_rx_timeout() to handle tout interrupt correctly
examples: update examples to use tout feature
driver: reflect changes of uart_set_always_rx_timeout() function, change uart.c
driver: change conditions to trigger workaround for tout feature in uart.c
driver: change uart_set_always_rx_timeout()
freemodbus: fix tabs, remove commented code
driver: remove uart_ll_is_rx_idle()
tout_thr - move calculation and masking into hal layer update driver and uart_ll (add uart_ll_set_rx_tout)
move tout calculation into uart_ll
move calculation of time out in bit time for esp32s2 into low level uart_ll.h file
move uart_hal_get_symb_len() into hal
update set_rx_timeout() to warn user about incorrect value
update HAL, LL 1
fix uart_xx_set_rx_tout() to convert symbol time into bit time
update param description
update tout calculation in LL
update uart_hal_get_max_rx_timeout_thrd() and uart_ll_get_max_rx_timeout_thrd()
* Add test support for ESP32S2
* Add loop back test
* Support chip internal connection, no external wiring required.
* Delete the relevant codes of PDM of ESP32-S2 ll layer.
* fix dac dma mode issue
* Let `[ignore] case` return to freedom
1) Because this test uses its own ISR, we need to release it with `esp_intr_free` instead of `pcnt_isr_service_uninstall`.
2) `pcnt_evt_queue` needs to be created before the interrupt is registered and needs to be released at the end of each case.
* Add test support for ESP32S2
* Support chip internal connection, no external wiring required.
The following commit refactors the CAN driver such that
it is split into HAL and Lowlevel layers. The following
changes have also been made:
- Added bit field members to can_message_t as alternative
to message flags. Updated examples and docs accordingly
- Register field names and fields of can_dev_t updated
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.
