The issue is introduced in 571864e8ae. The
esp_flash API tries to clear the QE bit when the flash is not working in
quad modes.
However this introduces a regression, compared to earlier versions and
the legacy API. When the chip is not detected, the generic chip driver
is used, which cannot 100% handle the QE bit properly for all flash
vendors. There may be some flash chips (e.g. MXIC) that can be used in
dual modes by legacy API, but output wrong data when the esp_flash API
clears the QE bit in a wrong way.
This commit reverts the QE force clearing behavior, so that it's safer
for the generic chip driver to work under dual modes.
The default chip driver (chip_generic) use command 01H + 2 bytes to
clear the QE bit. However this will accidently change the configuration
register value of the MXIC chip.
MXIC chip driver is added to fix that.
Allocation of the temporary internal buffer will now repeat until a small enough buffer can be
allocated, and only fail if less than a 256 byte block of internal RAM is free.
Adds unit test for the same, and generic test utility for creating memory pressure.
Previously would try allocate buffer of minimum size 16KB not maximum size 16KB, causing
out of memory errors for any large reads, or if less than 16KB contiguous free heap.
Also, if using legacy API and internal allocation failed then implementation would abort()
instead of returning the error to the caller.
Added test for using large buffers in PSRAM.
Closes https://github.com/espressif/esp-idf/issues/4769
Also reported on forum: https://esp32.com/viewtopic.php?f=13&t=14304&p=55972
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.
1. add hal and low-level layer for timer group
2. add callback functions to handle interrupt
3. add timer deinit function
4. add timer spinlock take function
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
There used to be dummy phase before out phase in common command
transactions. This corrupts the data.
The code before never actually operate (clear) the QE bit, once it finds
the QE bit is set. It's hard to check whether the QE set/disable
functions work well.
This commit:
1. Cancel the dummy phase
2. Set and clear the QE bit according to chip settings, allowing tests
for QE bits. However for some chips (Winbond for example), it's not
forced to clear the QE bit if not able to.
3. Also refactor to allow chip_generic and other chips to share the same
code to read and write qe bit; let common command and read command share
configure_host_io_mode.
4. Rename read mode to io mode since maybe we will write data with quad
mode one day.
esp_partition_register_external did not call load_partitions, so if
it was called before any call to esp_partition_find, then the main
partition table would never be loaded. Introduce new function,
ensure_partitions_loaded, and call it both from esp_partition_find and
esp_partition_register_external.
Closes https://github.com/espressif/esp-idf/issues/4116
1. The translation should be first reviewed by technical reviewers;
2. and then by language reviewers.
For the translation for the first batch of files, please see !MR5620 and !MR5613
During coredump, dangerous-area-checking should be disabled, and cache
disabling should be replaced by a safer version.
Dangerous-area-checking used to be in the HAL, but it seems to be more
fit to os functions. So it's moved to os functions. Interfaces are
provided to switch between os functions during coredump.
When legacy mode is used, the coredump still fails during linking
because "esp_flash_init_default_chip", "esp_flash_app_init" and
"esp_flash_default_chip " are not compiled and linked.
Instead of using ``if`` macros in callers, these functions are protected
by ``if`` macros in the header, and also not compiled in the sources.
"esp_flash_default_chip" variable is compiled with safe default value.
spi_flash has been updated and its functions work from flash by default instead of IRAM that cause issue
add Kconfig value into espcoredump to enable spi_flash legacy mode (CONFIG_SPI_FLASH_USE_LEGACY_IMPL) when core dump is selected
fix spi_flash issues to work correctly with legacy mode when CONFIG_SPI_FLASH_USE_LEGACY_IMPL is used
Add support for get write protection support, fixed the duplicated
set_write_protection link.
All the write_protection check in the top layer are removed. The lower
levels (chip) should ensure to disable write protection before the
operation start.
The name "start_addr" (which goes straight into the docs) implies
it's an absolute address while in fact it's an offset into the
partition like what's used in all the other esp_partition_*
functions.
So in order to avoid confusion make the name consistent with the
parameter names used for the other partition functions and call it
"offset".
Merges https://github.com/espressif/esp-idf/pull/3750
Do not include bootloader in flash target when secure boot is enabled.
Emit signing warning on all cases where signed apps are enabled (secure
boot and signed images)
Follow convention of capital letters for SECURE_BOOT_SIGNING_KEY
variable, since it is
relevant to other components, not just bootloader.
Pass signing key and verification key via config, not requiring
bootloader to know parent app dir.
Misc. variables name corrections
!4452 and !4897 made some ill-advised corrections to dependency info;
revert those in this MR. Handling pre-built binaries as imported
libraries is retained, however.
