..
analog_comparator
driver: Fix ana_cmpr negative enum comparison
2023-04-28 14:52:50 +08:00
components
spi_slave: add multi board test case for spi slave hd append mode
2023-03-21 11:30:17 +08:00
dac_test_apps
ci: update test apps to use run_all_single_board_cases
2023-03-10 14:27:09 +08:00
gpio
gpio: Re-enable gpio usb pins test cases on esp32h2
2023-03-09 17:21:43 +08:00
gpio_extensions
gptimer: fix race condition between start and stop
2023-03-10 23:27:29 +08:00
gptimer
gptimer: enlarge test threshold
2023-04-28 11:43:50 +08:00
i2c
CI: Move all UT in driver to test_app
2023-04-25 10:40:32 +08:00
i2s_test_apps
i2s: workaround for inacurate PLL frequency after switching
2023-04-17 03:15:55 +00:00
ledc
Merge branch 'refactor/rename_to_esp_clk_tree_prefix' into 'master'
2023-04-25 19:41:39 +08:00
legacy_adc_driver
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
legacy_mcpwm_driver
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
legacy_pcnt_driver
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
legacy_rmt_driver
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
legacy_rtc_temp_driver
TWDT: Use the new TWDT Kconfig options in the examples and tests
2023-02-17 11:22:25 +08:00
legacy_timer_driver
esp_clk_tree: Rename clk_tree_xxx to esp_clk_tree_xxx, add compilation warning to clk_tree.h
2023-04-25 14:12:06 +08:00
mcpwm
mcpwm: fix bldc example force output level inverted
2023-05-10 19:17:21 +08:00
parlio
ci: update test apps to use run_all_single_board_cases
2023-03-10 14:27:09 +08:00
pulse_cnt
ci: update test apps to use run_all_single_board_cases
2023-03-10 14:27:09 +08:00
rmt
rmt: define RMT_ENCODING_RESET in rmt_encode_state_t
2023-04-17 14:50:51 +08:00
rs485
esp32h2: add build test
2023-01-17 10:29:04 +08:00
sdio
sdio: test_sdio add unity sync signals
2023-04-17 10:51:46 +08:00
spi
Merge branch 'refactor/rename_to_esp_clk_tree_prefix' into 'master'
2023-04-25 19:41:39 +08:00
temperature_sensor
temperature_sensor: Implement temperature monitor interrupt feature on ESP32H2/ESP32C6
2023-03-03 10:38:40 +08:00
touch_sensor_v1
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
touch_sensor_v2
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
twai
ci: update driver tests to use run_all_single_board_cases()
2023-03-28 17:05:50 +08:00
uart
esp32h2: add build test
2023-01-17 10:29:04 +08:00