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alex
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esp-idf
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esp-idf
/
components
/
driver
/
test_apps
/
gpio
/
main
History
Song Ruo Jing
8db902c57b
gpio: Refactor pytest_gpio to separate cases with labels, and update to use new IdfDut class in pytest_embedded_idf
2022-12-20 15:28:33 +08:00
..
CMakeLists.txt
gpio: support glitch filter
2022-12-09 11:33:42 +08:00
test_app_main.c
unit test: move gpio, dedicated_gpio, sigmadelta unit test from unit-test-app to components/driver/test_apps/gpio
2022-03-30 15:11:08 +08:00
test_dedicated_gpio.c
hal: Move dedicated GPIO LL and HAL
2022-06-14 14:38:29 +08:00
test_gpio_filter.c
gpio_filter: Fix test case fail on esp32c6 due to slow io_mux clock compare to 160MHz cpu clock.
2022-12-13 19:18:34 +08:00
test_gpio.c
gpio: Refactor pytest_gpio to separate cases with labels, and update to use new IdfDut class in pytest_embedded_idf
2022-12-20 15:28:33 +08:00
test_gpio.h
esp32h2: renaming esp32h2 to esp32h4
2022-11-08 17:05:33 +08:00
test_rtcio.c
rtcio: Add a test case to test RTCIO's hold ability after deep sleep wakeup
2022-11-11 20:39:04 +08:00
test_sigma_delta_legacy.c
gpio: Refactor pytest_gpio to separate cases with labels, and update to use new IdfDut class in pytest_embedded_idf
2022-12-20 15:28:33 +08:00