esp-idf/components/fatfs/test_apps/README.md
2022-10-10 12:15:56 +02:00

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# fatfs component target tests
This directory contains tests for `fatfs` component which are run on chip targets.
See also [test_fatfs_host](../test_fatfs_host) directory for the tests which run on a Linux host.
Fatfs tests can be executed with different `diskio` backends: `diskio_sdmmc` (SD cards over SD or SPI interface), `diskio_spiflash` (wear levelling in internal flash) and `diskio_rawflash` (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:
- [sdcard](sdcard/) — runs fatfs tests with an SD card over SDMMC or SDSPI interface
- [flash_wl](flash_wl/) - runs fatfs test in a wear_levelling partition in SPI flash
- [flash_ro](flash_ro/) - runs fatfs test in a read-only (no wear levelling) partition in SPI flash
These test apps define:
- test functions
- setup/teardown routines
- build/test configurations
- pytest test runners
The actual test cases (many of which are common between the test apps) are defined in the [test_fatfs_common component](test_fatfs_common/).