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components
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build: Adds support for universal Clang toolchain
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2022-11-23 13:25:16 +03:00 |
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dac_test_apps
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dac: update API and file format aligning to the rule
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2022-11-03 13:04:50 +08:00 |
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gpio
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gpio: combine sdm, glitch filter, fast gpio tests into one app
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2022-12-29 14:46:16 +08:00 |
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gpio_extensions
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sdm: support sdm on esp32h2
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2023-01-13 16:55:51 +08:00 |
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gptimer
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gptimer: support RC_FAST clock source
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2022-12-26 13:18:25 +08:00 |
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i2s_test_apps
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test more freq
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2022-12-21 17:31:38 +08:00 |
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ledc
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ledc: Move ledc unit test to test_apps pytest framework
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2022-12-21 12:04:42 +08:00 |
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legacy_adc_driver
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adc: support ADC on esp32c6 (driver/test/example)
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2022-12-23 11:24:06 +08:00 |
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legacy_mcpwm_driver
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mcpwm: enable test on esp32c6
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2022-12-22 11:17:38 +08:00 |
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legacy_pcnt_driver
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pcnt: support pcnt on esp32h2
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2023-01-13 16:11:50 +08:00 |
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legacy_rmt_driver
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rmt: support pll clock source on esp32c6
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2022-12-22 11:25:54 +08:00 |
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legacy_rtc_temp_driver
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ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
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2022-11-28 11:58:30 +08:00 |
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legacy_timer_driver
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gptimer: support RC_FAST clock source
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2022-12-26 13:18:25 +08:00 |
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mcpwm
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mcpwm: support non-varg version of generator functions
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2023-01-03 14:42:49 +08:00 |
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pulse_cnt
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pcnt: support pcnt on esp32h2
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2023-01-13 16:11:50 +08:00 |
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rmt
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rmt: support pll clock source on esp32c6
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2022-12-22 11:25:54 +08:00 |
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rs485
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test: move rs485 test to test_app
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2022-11-11 16:59:40 +08:00 |
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sdio
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example/sdio: add support for ESP32-S3 as host (via SD)
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2022-11-21 14:03:41 +08:00 |
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spi
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test: formate test_spi_slave.c
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2023-01-04 15:35:04 +08:00 |
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temperature_sensor
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ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
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2022-11-28 11:58:30 +08:00 |
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touch_sensor_v1
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touch_senser: fixed ci issue timer expired after it is deleted
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2022-09-05 18:25:32 +08:00 |
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touch_sensor_v2
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touch_sensor: fix touch_sensor_v1 filter issue
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2022-08-23 07:34:51 +00:00 |
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twai
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twai: add initial version of driver component test
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2022-11-04 17:40:29 +08:00 |
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uart
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test: move uart test to test_app
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2022-11-11 16:59:40 +08:00 |
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