alex/esp-idf
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esp-idf/components/esp_driver_sdspi/test_apps/sdspi
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Ivan Grokhotkov 30abe85a25
ci(sdspi): clean up newlib memory, reset between tests 
Two changes to make the tests less susceptible to random failures:
- Free up newlib memory to not have false-positive memory leaks due to
  lazy allocations in reent structure
- Reset between tests, so that one failing test doesn't cause
  subsequent tests to fail

Both changes are already applied to esp_driver_sdmmc test app.
2024-05-02 16:44:16 +02:00
..
components/sdspi_tests ci(sdspi): re-enable probe/rw tests for slot 1 2024-05-02 16:44:16 +02:00
main ci(sdspi): clean up newlib memory, reset between tests 2024-05-02 16:44:16 +02:00
CMakeLists.txt refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-29 12:13:03 +08:00
pytest_sdspi.py ci(sdspi): clean up newlib memory, reset between tests 2024-05-02 16:44:16 +02:00
README.md refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-29 12:13:03 +08:00
sdkconfig.defaults refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-29 12:13:03 +08:00

README.md

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C6 ESP32-H2 ESP32-P4 ESP32-S2 ESP32-S3