esp-idf/components/esp_driver_sdspi/test_apps
Ivan Grokhotkov 30abe85a25
ci(sdspi): clean up newlib memory, reset between tests
Two changes to make the tests less susceptible to random failures:
- Free up newlib memory to not have false-positive memory leaks due to
  lazy allocations in reent structure
- Reset between tests, so that one failing test doesn't cause
  subsequent tests to fail

Both changes are already applied to esp_driver_sdmmc test app.
2024-05-02 16:44:16 +02:00
..
sdspi ci(sdspi): clean up newlib memory, reset between tests 2024-05-02 16:44:16 +02:00
.build-test-rules.yml refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-29 12:13:03 +08:00