wanlei ee02b71f1c feat(esp32c61): introduce target esp32c61

2024-03-01 21:12:25 +08:00

..

esp32

feat(sdio): sdio cross chip test app

2023-11-13 11:21:47 +08:00

esp32c2

refactor(spi_master): replace dma_ll in spi hal layer (part 2.1)

2023-12-28 19:58:54 +08:00

esp32c3

spi: add high freq test on different spi config

2023-02-27 11:27:57 +08:00

esp32c5

feat(uart): add HP/LP uart support on ESP32C5

2024-02-29 14:12:51 +08:00

esp32c6

feat(sdio): sdio cross chip test app

2023-11-13 11:21:47 +08:00

esp32c61

feat(esp32c61): introduce target esp32c61

2024-03-01 21:12:25 +08:00

esp32h2

feat(esp_timer): Re-enable tests on ESP32P4

2024-01-30 13:39:23 +02:00

esp32p4

fix(riscv): Added RISC-V functions to set interrupt threshold for CLIC targets

2024-02-28 08:51:37 +01:00

esp32s2

spi: add high freq test on different spi config

2023-02-27 11:27:57 +08:00

esp32s3

spi: add high freq test on different spi config

2023-02-27 11:27:57 +08:00

idf_performance.h

feat(sdio): sdio cross chip test app

2023-11-13 11:21:47 +08:00