esp-idf/components/driver/test_apps
Martin Vychodil 61e694d2f3 Merge branch 'fix/cd_input_sd_mode_fails' into 'master'
CI: sdcard tests fail fix

Closes IDFCI-1700

See merge request espressif/esp-idf!23505
2023-05-15 17:37:29 +08:00
..
analog_comparator driver: Fix ana_cmpr negative enum comparison 2023-04-28 14:52:50 +08:00
components spi_slave: add multi board test case for spi slave hd append mode 2023-03-21 11:30:17 +08:00
dac_test_apps ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
gpio gpio: Re-enable gpio usb pins test cases on esp32h2 2023-03-09 17:21:43 +08:00
gpio_extensions gptimer: fix race condition between start and stop 2023-03-10 23:27:29 +08:00
gptimer gptimer: enlarge test threshold 2023-04-28 11:43:50 +08:00
i2c CI: Move all UT in driver to test_app 2023-04-25 10:40:32 +08:00
i2s_test_apps i2s: workaround for inacurate PLL frequency after switching 2023-04-17 03:15:55 +00:00
ledc Merge branch 'refactor/rename_to_esp_clk_tree_prefix' into 'master' 2023-04-25 19:41:39 +08:00
legacy_adc_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_mcpwm_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_pcnt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rmt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rtc_temp_driver TWDT: Use the new TWDT Kconfig options in the examples and tests 2023-02-17 11:22:25 +08:00
legacy_timer_driver esp_clk_tree: Rename clk_tree_xxx to esp_clk_tree_xxx, add compilation warning to clk_tree.h 2023-04-25 14:12:06 +08:00
mcpwm mcpwm: fix bldc example force output level inverted 2023-05-10 19:17:21 +08:00
parlio ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
pulse_cnt ci: update test apps to use run_all_single_board_cases 2023-03-10 14:27:09 +08:00
rmt rmt: define RMT_ENCODING_RESET in rmt_encode_state_t 2023-04-17 14:50:51 +08:00
rs485 esp32h2: add build test 2023-01-17 10:29:04 +08:00
sdio CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
spi Merge branch 'refactor/rename_to_esp_clk_tree_prefix' into 'master' 2023-04-25 19:41:39 +08:00
temperature_sensor temperature_sensor: Implement temperature monitor interrupt feature on ESP32H2/ESP32C6 2023-03-03 10:38:40 +08:00
touch_sensor_v1 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
touch_sensor_v2 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
twai ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
uart esp32h2: add build test 2023-01-17 10:29:04 +08:00