alex/esp-idf
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esp-idf/components/driver/test
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Michael (XIAO Xufeng) 370a1fa6df Merge branch 'bugfix/fix_ci_about_touch_sensor_denoise_ut' into 'master' 
driver(touch): fix touch sensor denoise unit test case

Closes IDF-1834 and TIDF-13311

See merge request espressif/esp-idf!9150
2020-07-02 11:22:42 +08:00
..
adc_dma_test
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
2020-06-01 15:00:08 +08:00
dac_dma_test
driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
2020-05-18 19:55:30 +08:00
include/test
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
2020-06-01 15:00:08 +08:00
param_test
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
touch_sensor_test
driver(touch): fix touch sensor denoise unit test case
2020-06-19 22:15:51 +08:00
CMakeLists.txt
driver(adc): fix adc io init bug; add unit test to check;
2020-05-12 06:52:26 +00:00
component.mk
driver(adc): fix adc io init bug; add unit test to check;
2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c
driver(adc/dac): fix adc dac driver for esp32s2
2020-04-01 12:41:51 +08:00
test_adc_common.c
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
2020-06-01 15:00:08 +08:00
test_common_spi.c
spi: re-enable the unit tests for esp32s2beta
2019-12-23 10:22:59 +08:00
test_dac.c
driver(adc): add adc initial code before app_main for esp32s2.
2020-04-04 10:15:30 +08:00
test_gpio.c
GPIO: fix unit test issue on ESP32-S2
2020-02-26 11:12:09 +08:00
test_i2c.c
I2C: i2c.h/i2c.c applied new code formatting
2020-02-26 15:12:03 +08:00
test_i2s.c
driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
2020-05-18 19:55:30 +08:00
test_ledc.c
ci: disable case witout runners
2020-02-15 18:28:25 +08:00
test_pcnt.c
bugfix(pcnt): fix driver ut pcnt
2020-02-26 16:52:53 +08:00
test_pwm.c
ut: Move tests back from "esp32" subfolder
2020-01-06 17:13:53 +08:00
test_rmt.c
rmt: prefix caps name with SOC_
2020-03-25 17:14:00 +08:00
test_rs485.c
global: rename esp32s2beta to esp32s2
2020-01-22 12:14:38 +08:00
test_rtcio.c
rtcio: add hal for driver
2019-11-21 10:40:49 +08:00
test_sdio.c
sdio: fix the unit of performance test
2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp
sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards
2020-02-12 15:16:08 +08:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c
spi: fix config break and reduce overhead of the bus lock on SPI1
2020-04-22 16:06:13 +08:00
test_spi_master.c
spi: allow using esp_flash and spi_master driver on the same bus
2020-03-26 22:08:26 +08:00
test_spi_param.c
spi: add unit test for slave receiving length
2020-03-11 13:24:30 +08:00
test_spi_sio.c
global: rename esp32s2beta to esp32s2
2020-01-22 12:14:38 +08:00
test_spi_slave.c
spi: re-enable the unit tests for esp32s2beta
2019-12-23 10:22:59 +08:00
test_timer.c
bugfix(timer): improve timer unit test case
2020-06-15 16:12:51 +08:00
test_uart.c
driver: make sure UART is idle before starting the test
2020-06-24 15:50:51 +02:00