esp-idf/components/driver/test
houwenxiang b35d9002f3 driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
When I2S `i2s_comm_format_t` is set to `I2S_COMM_FORMAT_I2S_MSB`, the data should launch at first BCK. But not in fact, this MR fixed this issue.

For compatibility, several nwe parameters have been added, and the old parameters will be removed in the future.

    closes https://github.com/espressif/esp-idf/issues/5065

    closes https://github.com/espressif/esp-idf/issues/4957

    closes https://github.com/espressif/esp-idf/issues/2978

    closes https://github.com/espressif/esp-idf/issues/5136

    Merges https://github.com/espressif/esp-idf/pull/4522
2020-05-18 19:55:30 +08:00
..
adc_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
dac_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
include/test global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
CMakeLists.txt driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c driver(adc/dac): fix adc dac driver for esp32s2 2020-04-01 12:41:51 +08:00
test_adc_common.c driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_common_spi.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_dac.c driver(adc): add adc initial code before app_main for esp32s2. 2020-04-04 10:15:30 +08:00
test_gpio.c GPIO: fix unit test issue on ESP32-S2 2020-02-26 11:12:09 +08:00
test_i2c.c I2C: i2c.h/i2c.c applied new code formatting 2020-02-26 15:12:03 +08:00
test_i2s.c driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
test_ledc.c ci: disable case witout runners 2020-02-15 18:28:25 +08:00
test_pcnt.c bugfix(pcnt): fix driver ut pcnt 2020-02-26 16:52:53 +08:00
test_pwm.c ut: Move tests back from "esp32" subfolder 2020-01-06 17:13:53 +08:00
test_rmt.c rmt: prefix caps name with SOC_ 2020-03-25 17:14:00 +08:00
test_rs485.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_rtcio.c rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
test_sdio.c sdio: fix the unit of performance test 2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c test: driver/sigmadelta test case 2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c spi: fix config break and reduce overhead of the bus lock on SPI1 2020-04-22 16:06:13 +08:00
test_spi_master.c spi: allow using esp_flash and spi_master driver on the same bus 2020-03-26 22:08:26 +08:00
test_spi_param.c spi: add unit test for slave receiving length 2020-03-11 13:24:30 +08:00
test_spi_sio.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_spi_slave.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_timer.c driver/timer: fix software reset UT (again) 2019-11-24 21:10:50 +01:00
test_uart.c driver: test: Ensure UART is fully idle before starting loopback RX/TX test 2019-12-12 17:21:46 +11:00