esp-idf/components/driver/test_apps
2024-02-27 17:30:59 +08:00
..
components change(driver): reformat driver component with astyle_py 2024-02-26 11:47:05 +08:00
dac_test_apps/legacy_dac_driver change(driver): reformat driver component with astyle_py 2024-02-26 11:47:05 +08:00
i2s_test_apps ci(i2s): enable i2s ci tests on p4 2024-01-19 19:28:33 +08:00
legacy_adc_driver change(driver): reformat driver component with astyle_py 2024-02-26 11:47:05 +08:00
legacy_i2c_driver fix(i2c): Modify the test memory leak check threshold and add more file pattern 2024-02-27 17:30:59 +08:00
legacy_mcpwm_driver fix(mcpwm): enable mcpwm group clock before hal init 2024-01-15 18:13:56 +08:00
legacy_pcnt_driver change(pcnt): reenable the target test for esp32p4 2024-01-10 23:03:40 +08:00
legacy_rmt_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_rtc_temp_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_sigma_delta_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_timer_driver ci(p4): added todo jira for disabled tests on p4 2024-01-04 09:36:38 +08:00
touch_sensor_v1 change(driver): reformat driver component with astyle_py 2024-02-26 11:47:05 +08:00
touch_sensor_v2 change(driver): reformat driver component with astyle_py 2024-02-26 11:47:05 +08:00
twai fix(twai): enable twai interactive test for all targets on new std runner 2024-01-05 15:22:09 +08:00
.build-test-rules.yml fix(i2c): Modify the test memory leak check threshold and add more file pattern 2024-02-27 17:30:59 +08:00