Allocation of the temporary internal buffer will now repeat until a small enough buffer can be
allocated, and only fail if less than a 256 byte block of internal RAM is free.
Adds unit test for the same, and generic test utility for creating memory pressure.
Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .
Cleaned up header files from unnecessary headers (releated to soc/... headers).
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
1. ref_clock used in unit tests occasionally produces time off by ~100
microseconds shortly after being started. Add a delay to let
ref_clock stabilise, until the cause is found.
2. Reduce roundoff error accumulation which would occasionally cause
the test to fail, by choosing an overflow value which can be divided
by APB frequency.
3. Move time sampling part of the test into an IRAM function to
reduce variations due to cache behavior.
4. Remove calculation of "standard deviation" in the test, as what was
calculated was not actually standard deviation, and it did not add any
useful information.
New unity component can be used for testing other applications.
Upstream version of Unity is included as a submodule.
Utilities specific to ESP-IDF unit tests (partitions, leak checking
setup/teardown functions, etc) are kept only in unit-test-app.
Kconfig options are added to allow disabling certain Unity features.
