spi_flash: refactoring flash encryption implementations into new api
Closes IDFGH-4493, IDFGH-4423, and IDF-657
See merge request espressif/esp-idf!12569
Enable shared stack watchpoint for overflow detection
Enable unit tests:
* "test printf using shared buffer stack" for C3
* "Test vTaskDelayUntil" for S2
* "UART can do poll()" for C3
On C3 the cache is programmatically split between Icache and dcache and with the default setup we dont leave a lot pages
available for additional mmaps into instruction space. Disabling this test for now since any hypothetical use case for this
is no longer supported "out of the box"
There is no ccomp timer on C3, which means our performance tests will start
failing again due to variance caused by cache misses.
This MR adds TEST_PERFORMANCE_CCOMP_ macro that will only fail
performance test if CCOMP timer is supported on the target
From now on, we have two tags for esp_flash tests:
- [esp_flash] for main flash chip only tests
- [esp_flash_3] for tests with external flash chips
To Run all tests, type `[esp_flash`; to run tests for main flash chip
only, type `[esp_flash].
* changing dependencies from unity->cmock
* added component.mk and Makefile.projbuild
* ignore test dir in gen_esp_err_to_name.py
* added some brief introduction of CMock in IDF
The issue is introduced in 571864e8ae. The
esp_flash API tries to clear the QE bit when the flash is not working in
quad modes.
However this introduces a regression, compared to earlier versions and
the legacy API. When the chip is not detected, the generic chip driver
is used, which cannot 100% handle the QE bit properly for all flash
vendors. There may be some flash chips (e.g. MXIC) that can be used in
dual modes by legacy API, but output wrong data when the esp_flash API
clears the QE bit in a wrong way.
This commit reverts the QE force clearing behavior, so that it's safer
for the generic chip driver to work under dual modes.
Allocation of the temporary internal buffer will now repeat until a small enough buffer can be
allocated, and only fail if less than a 256 byte block of internal RAM is free.
Adds unit test for the same, and generic test utility for creating memory pressure.
Previously would try allocate buffer of minimum size 16KB not maximum size 16KB, causing
out of memory errors for any large reads, or if less than 16KB contiguous free heap.
Also, if using legacy API and internal allocation failed then implementation would abort()
instead of returning the error to the caller.
Added test for using large buffers in PSRAM.
Closes https://github.com/espressif/esp-idf/issues/4769
Also reported on forum: https://esp32.com/viewtopic.php?f=13&t=14304&p=55972
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.
