Commit Graph

43 Commits

Author SHA1 Message Date
harshal.patil
9bf48e77f0
fix(mbedtls): move interrupt allocation during initialization phase 2023-11-16 16:16:57 +05:30
Jiang Guang Ming
e882782f0d feat(mbedtls): add new option CONFIG_MBEDTLS_USE_CRYPTO_ROM_IMPL for mbedtls pytest 2023-10-23 13:10:44 +08:00
harshal.patil
4c0dd8388b
feat(mbedtls): Integrate the ecdsa export public key feature in mbedtls 2023-09-06 11:07:40 +05:30
Armando
7dbd3f6909 feat(ci): Enable p4 example, test_apps and unit tests CI build 2023-08-24 12:51:19 +08:00
Mahavir Jain
224a308fd5
ci(test): add SHA DMA mode test for large data in PSRAM
Covers a test scenario described in following issue:
https://github.com/espressif/esp-idf/issues/11915
2023-07-28 14:23:02 +05:30
harshal.patil
eb3dab8af4 ci(mbedtls): added a test for the mbedtls_internal_shaX_process API 2023-07-14 04:08:30 +00:00
Aditya Patwardhan
56f15ab017 Merge branch 'fix/mpi_incorrect_assert' into 'master'
fix(mbedtls): Fix incorrect assert for H/W MPI operations

Closes WIFI-5591 and IDFGH-10615

See merge request espressif/esp-idf!24737
2023-07-14 08:59:10 +08:00
Laukik Hase
20a3fcae48
fix(mbedtls): Fix incorrect assert for H/W MPI operations
- Closes https://github.com/espressif/esp-idf/issues/11850
2023-07-13 14:52:00 +05:30
Jiang Guang Ming
01b71b0978 fix(mbedtls): sha test will fail when run twice 2023-07-13 00:00:16 -07:00
morris
56a376c696 feat(esp_gdma): add hal interface for common operations
GDMA driver will be adapted to more DMA peripherals in the future.
This commit is to extract a minimal interface in the hal layer
2023-07-10 13:45:57 +08:00
Song Ruo Jing
921713fff4 uart: Support LP_UART port with UART driver on esp32c6 2023-06-16 07:31:40 +00:00
Konstantin Kondrashov
c350c3c504 Merge branch 'feature/cleanup_wrong_log_use' into 'master'
all: Removes unnecessary newline character in logs

Closes IDFGH-10197

See merge request espressif/esp-idf!24131
2023-06-15 21:49:49 +08:00
Marius Vikhammer
6d11c37ff1 core-system: trim build components for core-system test apps 2023-06-13 09:14:42 +08:00
KonstantinKondrashov
e72061695e all: Removes unnecessary newline character in logs
Closes https://github.com/espressif/esp-idf/issues/11465
2023-06-09 03:31:21 +08:00
Mahavir Jain
f7a01d8f90
aes: fix DMA descriptor calculation for the alignment case
The number of the DMA descriptors allocated for certain length (e.g.,
8176) were not sufficient (off by 1 error). This used to result in the
dynamic memory corruption as the region was modified beyond the
allocated range.

This change fixes the DMA descriptor calculation part and allocates
sufficient DMA descriptors based on the data length alignment considerations.

Test has also been added to cover the specific scenario in the CI.

Closes https://github.com/espressif/esp-idf/issues/11310
2023-05-31 14:19:58 +05:30
Cao Sen Miao
0f83970368 ci: Delete ccomp_timer in IDF(witch has been moved to component manager) 2023-05-15 14:58:51 +08:00
Sachin Parekh
39a5604c29 mbedtls/ecdsa: Add ECDSA signature generation test 2023-04-07 14:55:21 +05:30
Sachin Parekh
d2940c5ff3 mbedtls: Add port layer for ECDSA peripheral 2023-03-24 10:43:40 +05:30
harshal.patil
6b8bc64f31 test: enable mbedtls esp_crt_bundle test for esp32h2 2023-03-13 12:00:01 +05:30
Laukik Hase
47c153ad9e
mbedtls/test_apps: Fix performance logs
- For esp32-c2, the `CONFIG_NEWLIB_NANO_FORMAT` is enabled by
  default which does not allow printing `int64_t` values
- Copied these values to a `uint32_t` variable for printing
  them properly
2023-02-24 12:26:21 +05:30
Laukik Hase
9f0435faa4
mbedtls: Add test config with CONFIG_COMPILER_OPTIMIZATION_PERF 2023-02-21 18:45:25 +05:30
Omar Chebib
5e5343d429 TWDT: Use the new TWDT Kconfig options in the examples and tests 2023-02-17 11:22:25 +08:00
Cao Sen Miao
fd3e0b0b18 esp32h2(ci): enable target test 2023-02-15 10:20:43 +08:00
Laukik Hase
d4abf3ff45
mbedtls: Remove -Wno-format compile option for test app 2023-02-08 12:31:09 +05:30
harshal.patil
6206c1e213 mbedtls: enable RSA support for esp32c6 2023-02-03 11:46:42 +05:30
Sachin Parekh
b060179400 mbedtls/ecp: Fix incorrect ECP parameter value
- Add sanity checks in mbedtls port
- Add ECP test cases covering shorter scalar values
2023-01-18 14:24:57 +05:30
Aditya Patwardhan
634e408ca4 Merge branch 'fix/mbedtls_port_sanity_checks_and_return_values' into 'master'
mbedtls/port: refactor sanity checks and their return values

Closes IDF-3810

See merge request espressif/esp-idf!21987
2023-01-17 19:21:52 +08:00
Cao Sen Miao
94120b82c2 esp32h2: add build test 2023-01-17 10:29:04 +08:00
harshal.patil
5ee1e97e6f mbedtls: added a test of different auth-tag lengths in AES-GCM 2023-01-16 15:04:08 +05:30
Harshit Malpani
49ce5ada76
ci: Fix ci failures for target esp32c6 2023-01-04 11:20:52 +05:30
LiPeng
5c93fe47cb mbedtls: GCM implementation is replaced with CTR-based calculation
- GCM operation in mbedtls used ECB, which calculated only 16 bytes of data each time.
	- Therefore, when processing a large amount of data, it is necessary to frequently set hardware acceleration calculations,
	- which could not make good use of the AES DMA function to improve efficiency.
	- Hence, GCM implementation is replaced with CTR-based calculation which utilizes AES DMA to improve efficiency.
2022-12-28 12:14:29 +05:30
harshal.patil
e0f31edab5 test_aes_gcm: fix output_size paramter in mbedtls_get_update()
mbedtls_get_update() returned MBEDTLS_ERR_GCM_BUFFER_TOO_SMALL,
as 0 used to get passed in the output_size paramter.
2022-12-28 11:33:09 +05:30
harshal.patil
c15b36b9c4 mbedtls: populate mbedtls_gcm_update() output_length paramater 2022-12-28 11:33:09 +05:30
Song Ruo Jing
1575b9e43a ci: Disable all currently failed target tests for esp32c6 2022-11-28 12:09:08 +08:00
Martin Vychodil
c9c7573f71 Storage: Partition APIs moved to the new component 'esp_partition'
All the partition handling API functions and data-types were moved from the 'spi_flash' component to the new one named 'esp_partition'. See Storage 5.x migration guide for more details
2022-11-02 21:54:45 +01:00
Song Ruo Jing
be0fdfa176 soc: Add a soc cap, SOC_CLK_RC_FAST_D256_SUPPORTED, for whether the target has the RC_FAST_D256 clock 2022-11-01 11:23:26 +08:00
Mahavir Jain
6c8f6597f9
mbedtls: test_app: keep release config enabled for ESP32
Before `test_apps` migration, we had an independent release config,
but we can safely enable it in the default configuration for ESP32
target itself. This helps to catch any potential issues that may
occur in relevant tests because of compiler optimization flags.
2022-10-21 14:29:02 +05:30
Mahavir Jain
10dfabe650 Merge branch 'ecc/improve_mbedtls_ecdsa' into 'master'
mbedtls: Added performance test for ECP and ECDSA operation

See merge request espressif/esp-idf!19337
2022-10-14 15:49:22 +08:00
Laukik Hase
80204ecab2
ci: Fix esp32s2.psram.test_mbedtls_psram UT
- When PSRAM is enabled, the interrupt watchdog timeout value
  needs to be increased to 800 ms from the default 500 ms.
2022-10-13 10:27:05 +05:30
Sachin Parekh
130ada60ec mbedtls: Added performance tests for ECP and ECDSA operations 2022-10-13 10:01:06 +05:30
Laukik Hase
d7eb2c7b4e
mbedtls: MBEDTLS_PRIVATE & MBEDTLS_ALLOW_PRIVATE_ACCESS-related cleanup 2022-09-29 10:13:14 +05:30
harshal.patil
317eeddce4
fix: memory leaks check added 2022-09-17 14:31:36 +05:30
harshal.patil
146f101289
ci: Migrate mbedtls unit tests from unit-test-app to component-test-app 2022-09-17 14:31:36 +05:30