If the RTC crystal is bad or has no matched capacitance, then you do not need to start such the crystal. It is necessary to determine this case, output an error (about impossibility to start from the oscillator) and start from the internal RC of the chain.
Reduced the default value of the number of bootstrap cycles. Because we can oscillating the oscillator which then stops. (in Kconfig). Changed from 100 to 5.
The number of calibration cycles has been increased. It is the main criterion for estimating the launch of an oscillator. A large increase leads to an increase in the load time, as well as the stability of recognition of this case. (in Kconfig).
Changed from 1024 to 3000.
Previous version of the code only connected CD and WP to the
peripheral, in fact the hardware does not use the values of these
signals automatically. This adds code to read CD and WP values when
command is executed and return errors if card is not present, or
write command is executed when WP signal is active.
- Add SDIO support at protocol layer (probing, data transfer, interrupts)
- Add SDIO interrupts support in SDMMC host
- Add test (communicate with ESP32 in SDIO download mode)
Previous code contained a check for PLL frequency to be 240MHz, while
in fact 240MHz was a CPU frequency; corresponding PLL frequency is
480MHz. Fixed the comparison and replaced integer MHz values with an
enum.
1. External 32kHz crystal is started for too long or it may not start at all. It is often observed at the first start.
2. At the first start, it is possible that the crystal did not start. And the recorded period was recorded as 0. Which led to a division error by zero during the transition to the deep sleep mode (Maybe somewhere else).
3. Added a unit test to test a new method of oscillation an external crystal.
4. Added a new method of oscillating of an external crystal. The legs of the crystal are fed with a 32 kHz frequency.
The new method eliminates these errors.
Added unit test: `\esp-idf\components\soc\esp32\test\test_rtc_clk.c`: `make TEST_COMPONENTS=soc`
- 8 Test starting external RTC crystal. Will pass.
`Bootstrap cycles for external 32kHz crystal` - is specified in the file Kconfig by default 100.
QA tested a new method of oscillation the crystal on 25 boards. The supply of square waves on the crystal showed a 100% result in contrast to the previous method of launching the crystal. After the tests, the old method was deleted.
Closes TW19143
The fast path of CPU frequency switch function, used in DFS, was not
waiting for the frequency switch to complete when switching from XTAL
to PLL. This resulted in incorrect reads from peripherals on APB,
where two consecutive reads could return the same value. For example,
in esp_timer, read of FRC_COUNT_REG would return same value as the
preceding read of FRC_ALARM_REG, causing time to jump by the value of
FRC_ALARM_REG / apb_freq_mhz.
This commit adds support for CPU max freqeuency rating
bits in CPU. Bootloader will now print an error if attempting
to 160MHz rated ESP32 at 240MHz.
EFUSE_CHIP_VER_RESERVE has been replaced by the
frequency rating bits. Dependancies on EFUSE_CHIP_VER_RESERVE
have been changed to use EFUSE_CHIP_VER_PKG
This commit removes the lookup table mode due to inferior performance when compared
to linear mode under attenuation 0, 1 and 2. However small portions of the lookup table
are kept for the higher voltages of atten 3 (above ADC reading 2880). That voltage range
in atten 3 has non linear characteristics making the LUT performan better than linear mode.
This commit updates the esp_adc_cal ocmponent to support new calibration methods
which utilize calibratoin values stored in eFuse. This commit includes LUT mode
The TRM describes IOMUX registers are IO_MUX_x_REG for x in GPIO0-39.
Until now ESP-IDF describes them as PERIPHS_IO_MUX_(pinname)_U
This commit adds additional IOMUX register names which match the ones used in the TRM.
RTC_FAST_CLK_FREQ_APPROX is defined as 8500000, so 0.5MHz part was lost
when dividing by MHZ. Since cal_val is 64-bit the parens can be removed.
With 40MHz XTAL for a nominal ESP32 chip, this fixes estimated XTAL
frequency from 38 to 40MHz.
To achieve reliable operation with GD flash at 80MHz, need to raise
core voltage.
This causes the following current consumption increase:
At 80MHz: from 29mA to 33mA
At 160MHz: from 41mA to 47mA
Test conditions: 2 cores running code from IRAM, remaining peripherals
clock gated.
