alex/esp-idf
alex/esp-idf
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17,344 Commits 20 Branches 148 Tags 384 MiB
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14 Commits

Author SHA1 Message Date
Angus Gratton
27a9cf861e driver: Add esp32c3 drivers (except ADC/DAC) and update tests 
Some ESP32-C3 drivers are still pending.

Based on internal commit 3ef01301fffa552d4be6d81bc9d199c223224305
 2020-12-23 09:53:24 +11:00
morris
9fa06719fa global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
michael
d16ad4a67a ci: disable case witout runners 2020-02-15 18:28:25 +08:00
morris
e30cd361a8 global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
michael
4220752aed ut: Move tests back from "esp32" subfolder 
DISABLED_FOR_TARGETS macros are used

Partly revert "ci: disable unavailable tests for esp32s2beta"

This partly reverts commit 76a3a5fb48.

Partly revert "ci: disable UTs for esp32s2beta without runners"

This partly reverts commit eb158e9a22.

Partly revert "fix unit test and examples for s2beta"

This partly reverts commit 9baa7826be.

Partly revert "efuse: Add support for esp32s2beta"

This partly reverts commit db84ba868c.
 2020-01-06 17:13:53 +08:00
chenjianqiang
41fca84064 bugfix(ledc): fix crash when use one speed mode and enable ledc fade test case 2019-12-16 02:49:26 +00:00
houwenxiang
30b2e02088 bugfix(LEDC):fix ledc CI issue for esp32s2beta. 2019-11-14 12:20:29 +08:00
Michael (XIAO Xufeng)
9baa7826be fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
kooho
2e8c85d8ff driver(ledc): fixed ledc clock selection bug. 2019-08-06 16:11:18 +08:00
Konstantin Kondrashov
399d2d2605 all: Using xxx_periph.h 
Using xxx_periph.h in whole IDF instead of xxx_reg.h, xxx_struct.h, xxx_channel.h ... .

Cleaned up header files from unnecessary headers (releated to soc/... headers).
 2019-06-03 14:15:08 +08:00
morris
c159984264 separate rom from esp32 component to esp_rom 
1. separate rom include files and linkscript to esp_rom
2. modefiy "include rom/xxx.h" to "include esp32/rom/xxx.h"
3. Forward compatible
4. update mqtt
 2019-03-21 18:51:45 +08:00
houchenyao
836d01dcea ledc test: ignore one case. 
a bug caused by pcnt. it will fail randomly caused by PCNT bug. It will open when PCNT problem is resolved
 2018-09-06 19:43:30 +08:00
houchenyao
22ac8cf424 ledc test: test low speed mode frequency. 
remove the comment to test the scenario that ledc in low speed mode frequency can be changed, to make sure the bug has been resolved
 2018-09-06 17:44:39 +08:00
houchenyao
339d381019 test: components/driver: ledc case 2018-06-19 02:00:42 +08:00