Commit Graph

24 Commits

Author SHA1 Message Date
morris
3bcd9278fa i2s: expose resource object to other component 2021-08-10 21:06:59 +08:00
laokaiyao
f863998e90 driver/i2s: support mclk 2021-08-04 10:20:03 +08:00
laokaiyao
3c57a6ac36 driver/i2s: refactor ll and hal 2021-08-04 10:20:03 +08:00
laokaiyao
d51b85989b doc/i2s: update i2s programming guide on s3 & c3 2021-08-04 10:20:03 +08:00
laokaiyao
f7f8c9c11f driver/i2s: support i2s on c3 and s3
1. Support i2s on esp32c3 and esp32s3
    2. Refactor i2s_config_t to avoid breaking change
    2. Fix a bug that receiving unavailable values from message queue when dma queue has been re-allocted
    4. Support i2s unit test on esp32c3 and esp32s3
2021-08-04 10:20:03 +08:00
houwenxiang
2f1247e1c4 driver: support I2S on ESP32-S3 & ESP32-C3
1. refactor I2S driver.
  2. support TDM mode for esp2s3 & esp32c3.
2021-08-04 10:20:03 +08:00
Jan Brudný
58f79e6b00 driver: update copyright notice 2021-05-24 01:06:17 +02:00
Omar Chebib
cd79f3907d gpio: Disable USB JTAG when setting pins 18 and 19 as GPIOs on ESP32C3
When `DIS_USB_JTAG` eFuse is NOT burned (`False`), it is not possible
to set pins 18 and 19 as GPIOs. This commit solves this by manually
disabling USB JTAG when using pins 18 or 19.
The functions shall use `gpio_hal_iomux_func_sel` instead of
`PIN_FUNC_SELELECT`.
2021-04-08 14:01:18 +08:00
Angus Gratton
27a9cf861e driver: Add esp32c3 drivers (except ADC/DAC) and update tests
Some ESP32-C3 drivers are still pending.

Based on internal commit 3ef01301fffa552d4be6d81bc9d199c223224305
2020-12-23 09:53:24 +11:00
morris
9fa06719fa global: enable build uinit test for esp32-s3 2020-09-22 15:15:03 +08:00
morris
a4d0033c03 esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
houwenxiang
b35d9002f3 driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
When I2S `i2s_comm_format_t` is set to `I2S_COMM_FORMAT_I2S_MSB`, the data should launch at first BCK. But not in fact, this MR fixed this issue.

For compatibility, several nwe parameters have been added, and the old parameters will be removed in the future.

    closes https://github.com/espressif/esp-idf/issues/5065

    closes https://github.com/espressif/esp-idf/issues/4957

    closes https://github.com/espressif/esp-idf/issues/2978

    closes https://github.com/espressif/esp-idf/issues/5136

    Merges https://github.com/espressif/esp-idf/pull/4522
2020-05-18 19:55:30 +08:00
fuzhibo
406b8f423d driver(adc): add adc initial code before app_main for esp32s2.
update phy v301
2020-04-04 10:15:30 +08:00
fuzhibo
baa7898e35 driver(adc/dac): fix adc dac driver for esp32s2
1. update register file about adc; 2. fix adc driver; 3. add UT for adc/dac;

See merge request espressif/esp-idf!7776
2020-04-01 12:41:51 +08:00
xiongyu
b3ae9fa978 bugfix(i2s): Updated ESP32-S2 ADC DAC support
* Delete the relevant codes of ADC DAC of ESP32-S2.
2020-03-03 12:59:30 +08:00
fuzhibo
3ad5138dd8 fix coexist i2s_adc and rtc_adc 2020-03-03 11:58:53 +08:00
xiongyu
faf898b659 bugfix(i2s): fix driver ut i2s
* Add test support for ESP32S2

* Add loop back test

* Support chip internal connection, no external wiring required.

* Delete the relevant codes of PDM of ESP32-S2 ll layer.

* fix dac dma mode issue
2020-03-03 11:58:53 +08:00
morris
e30cd361a8 global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
michael
4220752aed ut: Move tests back from "esp32" subfolder
DISABLED_FOR_TARGETS macros are used

Partly revert "ci: disable unavailable tests for esp32s2beta"

This partly reverts commit 76a3a5fb48.

Partly revert "ci: disable UTs for esp32s2beta without runners"

This partly reverts commit eb158e9a22.

Partly revert "fix unit test and examples for s2beta"

This partly reverts commit 9baa7826be.

Partly revert "efuse: Add support for esp32s2beta"

This partly reverts commit db84ba868c.
2020-01-06 17:13:53 +08:00
Mahavir Jain
8b05cf41ad i2s: enable tests for esp32s2beta 2019-12-16 11:53:33 +05:30
Michael (XIAO Xufeng)
76a3a5fb48 ci: disable unavailable tests for esp32s2beta 2019-09-04 10:53:25 +10:00
Michael (XIAO Xufeng)
9baa7826be fix unit test and examples for s2beta 2019-09-04 10:53:25 +10:00
Ajita Chavan
070b86eee5 i2s: test case for variation in apll clock rate 2019-06-20 16:40:58 +00:00
houchenyao
44fdca94e9 test: components/driver: i2s case 2018-11-29 11:32:40 +08:00