When `DIS_USB_JTAG` eFuse is NOT burned (`False`), it is not possible
to set pins 18 and 19 as GPIOs. This commit solves this by manually
disabling USB JTAG when using pins 18 or 19.
The functions shall use `gpio_hal_iomux_func_sel` instead of
`PIN_FUNC_SELELECT`.
* Add test support for ESP32S2
* Add loop back test
* Support chip internal connection, no external wiring required.
* Delete the relevant codes of PDM of ESP32-S2 ll layer.
* fix dac dma mode issue
DISABLED_FOR_TARGETS macros are used
Partly revert "ci: disable unavailable tests for esp32s2beta"
This partly reverts commit 76a3a5fb48.
Partly revert "ci: disable UTs for esp32s2beta without runners"
This partly reverts commit eb158e9a22.
Partly revert "fix unit test and examples for s2beta"
This partly reverts commit 9baa7826be.
Partly revert "efuse: Add support for esp32s2beta"
This partly reverts commit db84ba868c.