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Merge branch 'bugfix/increase_overhead_when_test_adc_continuous_iram' into 'master'

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esp_adc: increase test consumption threshold

Closes IDFCI-1397

See merge request espressif/esp-idf!19206
This commit is contained in:
Armando (Dou Yiwen) 2022-07-27 16:16:23 +08:00
commit 1ed5e5130e
2 changed files with 2 additions and 2 deletions
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2
components/driver/test_apps/legacy_adc_driver/main/test_app_main.c
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@ -8,7 +8,7 @@
#include "unity_test_runner.h"
#include "esp_heap_caps.h"
#define TEST_MEMORY_LEAK_THRESHOLD (-300)
#define TEST_MEMORY_LEAK_THRESHOLD (-400)
static size_t before_free_8bit;
static size_t before_free_32bit;

2
components/esp_adc/test_apps/adc/main/test_adc_driver_iram.c
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@ -219,7 +219,7 @@ TEST_CASE("ADC continuous work with ISR and Flash", "[adc_oneshot]")
//This may need to be bigger, when the sampling freq is low
uint32_t overhead_us = 150;
#else
uint32_t overhead_us = 0;
uint32_t overhead_us = 50;
#endif
uint32_t wait_time_us = (1000 * 1000 / ADC_TEST_FREQ_HZ * ADC_TEST_PKG_SIZE / SOC_ADC_DIGI_RESULT_BYTES) + overhead_us;
printf("period is %d us\n", wait_time_us);