alex/esp-idf
alex/esp-idf
1
0
Fork 0
mirror of https://github.com/espressif/esp-idf.git synced 2024-10-05 20:47:46 -04:00
Code Issues Actions 2 Packages Projects Releases Wiki Activity

esp_adc: increase adc continuous iram test time overhead a bit

Browse Source 
Prior to this commit, overhead is 0us on esp32s2, s3, c3, c2. However
when the conv_done event happens, software takes some time to do
necessary operations.
This commit is contained in:
Armando 2022-07-25 10:40:52 +08:00
parent 29189198b9
commit 0e6c8aef19
2 changed files with 2 additions and 2 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

2
components/driver/test_apps/legacy_adc_driver/main/test_app_main.c
View File

@ -8,7 +8,7 @@
#include "unity_test_runner.h"
#include "esp_heap_caps.h"
#define TEST_MEMORY_LEAK_THRESHOLD (-300)
#define TEST_MEMORY_LEAK_THRESHOLD (-400)
static size_t before_free_8bit;
static size_t before_free_32bit;

2
components/esp_adc/test_apps/adc/main/test_adc_driver_iram.c
View File

@ -219,7 +219,7 @@ TEST_CASE("ADC continuous work with ISR and Flash", "[adc_oneshot]")
//This may need to be bigger, when the sampling freq is low
uint32_t overhead_us = 150;
#else
uint32_t overhead_us = 0;
uint32_t overhead_us = 50;
#endif
uint32_t wait_time_us = (1000 * 1000 / ADC_TEST_FREQ_HZ * ADC_TEST_PKG_SIZE / SOC_ADC_DIGI_RESULT_BYTES) + overhead_us;
printf("period is %d us\n", wait_time_us);