esp-idf/tools/test_apps/storage/sdmmc_console
2024-04-12 12:56:18 +02:00
..
components fix(sdmmc): remove the legacy test cases from 'components/sdmmc/test' 2023-12-06 11:14:20 +01:00
main feat(sdmmc): add support for PSRAM DMA on ESP32-P4 2024-04-12 12:56:18 +02:00
CMakeLists.txt refactor(sdspi): added component pytest cases and enabled them on CI 2023-11-29 12:13:03 +08:00
partitions.csv fix(sdmmc): Migrate erase/trim test cases from unit-test-app to component-test-app 2023-12-06 11:07:33 +01:00
README.md ci(esp32c5mp): disable the unsupported tests 2024-04-07 12:13:29 +08:00
sdkconfig.defaults fix(sdmmc): Migrate erase/trim test cases from unit-test-app to component-test-app 2023-12-06 11:07:33 +01:00
sdkconfig.defaults.esp32h2 fix(sdmmc): add pytest script to component test app 2023-12-06 11:14:20 +01:00
sdkconfig.defaults.esp32p4 feat(sdmmc): add support for PSRAM DMA on ESP32-P4 2024-04-12 12:56:18 +02:00

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C5 ESP32-C6 ESP32-P4 ESP32-S2 ESP32-S3

SDMMC Test Application

This app is used to test the SDMMC protocol layer (in sdmmc component), as well as SDMMC and SDSPI drivers (in driver component).

The app serves two purposes:

  1. It allows various Unity test cases for SDMMC protocol layer features: probing, data transfer, etc.
  2. It also allows running lower level operations from the console, which makes it useful as a debugging/hacking/experimentation tool when investigating SDMMC issues.
    • Initializing the SDMMC host in various modes
    • Probing the card
    • (more to come: sending commands, reading/writing data, etc.)

SDMMC test app code overview

The app consists of several components:

  • main — small amount of code to initialize the console and register all the commands.
  • components/cmd_unity — console command to run Unity tests.
  • components/cmd_sdmmc — console commands for SDMMC low-level operations.
  • components/sdmmc_test_board — contains pin mappings for various development boards, and APIs for tests to access them.
  • components/sdmmc_test — contains the actual test cases.

Supported boards

  • ESP32-WROVER-KIT
  • ESP32 eMMC test board (black board with two SD card slots and eMMC)
  • ESP32-S3 USB_OTG v1. (Also works with an older ESP32-S2 variant of the board.)
  • ESP32-S3 eMMC test board (white board with two SD card slots and eMMC)
  • ESP32-S3-EYE
  • Breakout board for ESP32-C3 DevKitM-1
  • Custom board definition: specify the pin mapping in menuconfig.

Using the app

Select the target, configure, build and flash the app

  1. Choose the chip target, and open menuconfig:
    idf.py set-target esp32
    idf.py menuconfig
    
  2. Select the development board in SDMMC Test Board Configuration menu. This will select the correct pins for the SD card slot on the board.
  3. Save the configuration and exit menuconfig.
  4. Build the app:
    idf.py build
    
  5. Flash and monitor:
    idf.py flash monitor
    

Advanced: multiple build configurations side-by-side

It is often useful to verify changes in sdmmc component on multiple chips or development boards. To do this, it is possible to build the app multiple times, with different configurations, keeping the builds in separate directories.

  1. Build the app for the first target. This command does multiple things: selects the target, sets the build directory to build_esp32, and puts the sdkconfig file into the build directory:
    idf.py -D IDF_TARGET=esp32 -B build_esp32 -D SDKCONFIG=build_esp32/sdkconfig build
    
  2. Flash and monitor. Note that the build directory has to be specified with -B option:
    idf.py -B build_esp32 flash monitor
    
  3. Now you can build the app for the second target in another build directory:
    idf.py -D IDF_TARGET=esp32s3 -B build_esp32s3 -D SDKCONFIG=build_esp32s3/sdkconfig build
    
  4. Flash and monitor, again specifying the build directory:
    idf.py -B build_esp32s3 flash monitor
    

Compared to the idf.py set-target approach, this method allows keeping multiple build configurations side-by-side, and switching between them easily. If you have multiple terminal windows open, you can use one window per board. Set ESPPORT environment variable to the correct serial port in each window, and flash and monitor the app in each window with the corresponding build directory (-B) argument.

Console commands

The app supports the following console commands:

  • Common system commands: help, restart, version, free, heap
  • Log control: log_level <tag> <level> — dynamically change the log level for a given tag. For example, log_level sdmmc_req debug will enable debug logging in sdmmc_transaction.c
  • Running unit tests: test [index|name|tag|*].
    • If no argument is given, prints the list of available tests.
    • If a test index is given, runs the test with that index.
    • If a test name is given, runs the test with that name.
    • If a test tag is given, runs all tests with that tag. You can negate the tag by prefixing it with !, for example test ![sdspi] will run all tests except those tagged with [sdspi].
  • SDMMC low-level commands: sdmmc_host_init, sdmmc_host_deinit, card_init, card_info. Refer to the help output for more details.

As most other IDF console applications, the app supports line editing, commands history and tab completion.

Running test cases

When running the tests, keep in mind that once an SD card has been initialized in SPI mode, it cannot be re-initalized in SD mode without first powering it off. This means that on boards without an SD card power control circuit, it is not possible to run all the tests in one go with test * command. Run SDMMC tests first, then SDSPI tests: test [sdmmc] and then test [sdspi]. If you need to run SDMMC test again, power cycle the card first.

On chips without an SDMMC host controller only SDSPI tests are compiled. In this case, test * can be used to run all tests.

Skipped tests

To make the app compatible with various development boards without having lots of ifdefs in test cases, the tests will be ignored if the board is not compatible with the test case. For example, on boards with just one SD card slot (Slot 1), every test which uses Slot 0 is skipped.

For example, when running sdspi tests on ESP32-WROVER-KIT you will see something like this:

12 Tests 0 Failures 5 Ignored

This means that the 5 tests which use Slot 0 were skipped.