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fc1e8b0365
esp-idf/components/heap/test_apps/heap_tests/main
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Guillaume Souchere 110aac240d heap: Add a configuration that places all the heap component and related functionalities in flash when enabled 
Add test configuration to run all tests with heap component in the flash.
Add reference to this new configuration in performance section of the documentation.
2023-04-12 08:11:24 +02:00
..
CMakeLists.txt ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_aligned_alloc_caps.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_allocator_timings.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_corruption_check.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_diram.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_heap_main.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_heap_trace.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_malloc_caps.c heap: Add a configuration that places all the heap component and related functionalities in flash when enabled 2023-04-12 08:11:24 +02:00
test_malloc.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_realloc.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
test_runtime_heap_reg.c ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00