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b76123af06
feat(fatfs): Allow expanding files with seeking and truncating functions Closes IDFGH-12035 See merge request espressif/esp-idf!28945 |
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flash_ro | ||
flash_wl | ||
sdcard | ||
test_fatfs_common | ||
.build-test-rules.yml | ||
README.md |
fatfs component target tests
This directory contains tests for fatfs
component which are run on chip targets.
See also test_fatfs_host directory for the tests which run on a Linux host.
Fatfs tests can be executed with different diskio
backends: diskio_sdmmc
(SD cards over SD or SPI interface), diskio_spiflash
(wear levelling in internal flash) and diskio_rawflash
(read-only, no wear levelling, internal flash). There is one test app here for each of these backends:
- sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
- flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
- flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash
These test apps define:
- test functions
- setup/teardown routines
- build/test configurations
- pytest test runners
The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.