alex/esp-idf
alex/esp-idf
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f339b3fc96
esp-idf/tools/test_apps/system/build_test
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Konstantin Kondrashov f339b3fc96 efuse(esp32): Deprecate esp_efuse_burn_new_values() & esp_efuse_write_random_key() 
These functions were used only for esp32 in secure_boot and flash encryption.
Use idf efuse APIs instead of efuse regs.
2021-06-17 07:21:36 +08:00
..
main Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
CMakeLists.txt ci: add build test for custom console UART pins 2020-02-19 08:13:23 +01:00
README.txt ci: add build test for custom console UART pins 2020-02-19 08:13:23 +01:00
sdkconfig.ci.custom_uart ci: add build test for custom console UART pins 2020-02-19 08:13:23 +01:00
sdkconfig.ci.flash_encryption_release efuse(esp32): Deprecate esp_efuse_burn_new_values() & esp_efuse_write_random_key() 2021-06-17 07:21:36 +08:00
sdkconfig.ci.no_flash_delay test_apps: add build test for !CONFIG_SPI_FLASH_YIELD_DURING_ERASE 2020-06-02 15:42:24 +02:00
sdkconfig.ci.panic_handler_iram esp_common: allow placing panic handler into IRAM on ESP32-S2 2020-07-22 21:57:58 +02:00
sdkconfig.ci.phy_multiple_init_data esp32s2: fix when enable multi phy init data bin compile err. 2020-03-11 18:03:21 +08:00
sdkconfig.ci.rtc_gpio_desc test_apps: add build test case for RTC GPIO descriptor configuration 2020-12-21 13:57:07 +05:30
sdkconfig.ci.trax ci: add build test for TRAX feature 2020-02-19 14:02:35 +01:00
sdkconfig.ci.usb_serial_jtag * ets_delay_us(1) has too much overhead; change logic 2021-04-28 16:38:24 +08:00

README.txt 

This project is for testing if the application can be built with a particular sdkconfig setting.

To add new configuration, create one more sdkconfig.ci.NAME file in this directory.
To make the configuration target-specific, add a CONFIG_IDF_TARGET="name" line.

If you need to test for anything other than building, create another test project.