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esp-idf/examples/storage
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Mahavir Jain 377267775c examples/spiffs: increase test timeout 
This is to address frequent CI test failure where test most likely
timeouts during SPIFFS formatting operation.
2022-02-24 09:19:53 +05:30
..
custom_flash_driver [examples]: removed hyphens 2021-10-09 13:58:24 +08:00
ext_flash_fatfs spi_flash: reverted unwilling cs_setup argument 2021-06-04 15:29:53 +08:00
nvs_rw_blob tools: replace _ with - in idf.py 2021-10-13 17:30:38 +08:00
nvs_rw_value tools: replace _ with - in idf.py 2021-10-13 17:30:38 +08:00
nvs_rw_value_cxx tools: replace _ with - in idf.py 2021-10-13 17:30:38 +08:00
partition_api example_tests: Deletes usage esp32c3 ECO0 in CI (by default ECO3) 2021-09-24 13:55:07 +08:00
parttool example_tests: Deletes usage esp32c3 ECO0 in CI (by default ECO3) 2021-09-24 13:55:07 +08:00
sd_card sdspi: enable UT & ExampleTest for C3/S2 2021-09-24 15:17:18 +08:00
semihost_vfs style: format python files with isort and double-quote-string-fixer 2021-01-26 10:49:01 +08:00
spiffs examples/spiffs: increase test timeout 2022-02-24 09:19:53 +05:30
spiffsgen example_tests: Deletes usage esp32c3 ECO0 in CI (by default ECO3) 2021-09-24 13:55:07 +08:00
wear_levelling tools: replace _ with - in idf.py 2021-10-13 17:30:38 +08:00
README.md Replace all DOS line endings with Unix 2018-07-12 19:10:37 +08:00

README.md

Storage Examples

Storage and management of user and system data in module’s flash and on external memory / devices.

See the README.md file in the upper level examples directory for more information about examples.