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esp-idf/components/fatfs/test_apps
History
Fu Hanxi c1301c6145
build: bypass build issues
2024-01-10 15:34:50 +01:00
..
flash_ro feat(storage): Update build test rules for storage related components 2024-01-02 13:10:59 +01:00
flash_wl feat(storage): Update build test rules for storage related components 2024-01-02 13:10:59 +01:00
sdcard feat(storage): Update build test rules for storage related components 2024-01-02 13:10:59 +01:00
test_fatfs_common feat(vfs/fatfs): Add option for automatic immediate fsync 2023-10-02 07:06:05 +02:00
.build-test-rules.yml build: bypass build issues 2024-01-10 15:34:50 +01:00
README.md fatfs: add missing readme file for the test apps 2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

  • sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
  • flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
  • flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

  • test functions
  • setup/teardown routines
  • build/test configurations
  • pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.