alex/esp-idf
alex/esp-idf
1
0
Fork 0
mirror of https://github.com/espressif/esp-idf.git synced 2024-10-05 20:47:46 -04:00
Code Issues Actions 2 Packages Projects Releases Wiki Activity
eaff702df1
esp-idf/components/idf_test/integration_test/IT_BTSTK_GAP.yml

1781 lines
57 KiB
YAML
Raw Blame History

test cases:
- ID: BTSTK_GAP_01001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP param device name test
summary: ble set ascii device name
steps: |
1. DUT1 set ascii device name
2. stop advertising
3. config scan response and start advertising
4. DUT2 do active scan
expected result: |
1. succeed
2. succeed
3. succeed
4. device name in scan result
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3"
- ["R SSC2 P <dut1_ble_name>"]
- ID: BTSTK_GAP_01002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP param device name test
summary: ble set non-ascii device name
steps: |
1. DUT1 set non-ascii device name
2. stop advertising
3. config scan response and start advertising
4. DUT2 do active scan
expected result: |
1. succeed
2. succeed
3. succeed
4. device name in scan result
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name_hex>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3"
- ["R SSC2 P <dut1_ble_name_hex>"]
- ID: BTSTK_GAP_01003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP param device name test
summary: ble set long device name
steps: |
1. DUT1 set 32 byte device name A
2. stop advertising
3. config scan response and start advertising
4. DUT2 do active scan
5. DUT1 set 33 bytes device name
6. stop advertising
7. config scan response and start advertising
8. DUT2 do active scan
expected result: |
1. succeed
2. succeed
3. succeed
4. DUT1 mac in scan result (device name is too long)
5. failed
6. succeed
7. succeed
8. DUT1 mac in scan result (device name is too long)
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name_32>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0 -s 1"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3"
- ["R SSC2 P <dut1_bt_mac>"]
- - "SSC SSC1 ble -S -z name -n 123456789012345678901234567890123"
- ["R SSC1 C +BLE:ERROR"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0 -s 1"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3"
- ["R SSC2 P <dut1_bt_mac>"]
- ID: BTSTK_GAP_02001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response include name
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 set include device name for adv data and scan response
3. DUT1 start advertising
4. PC do active scan and capture advertising report
5. DUT1 stop advertising
6. DUT1 set not include device name for adv data and scan response
7. DUT1 start advertising
8. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get complete device name in ADV_IND and SCAN_RSP
5. succeed
6. succeed
7. succeed
8. do not have complete device name in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -n 1 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.NameComplete=<dut1_ble_name>)'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.NameComplete=<dut1_ble_name>)'
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -n 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.NameComplete)'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.NameComplete)'
- ID: BTSTK_GAP_02002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response include Tx power
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 set include Tx power for adv data and scan response
3. DUT1 start advertising
4. PC do active scan and capture advertising report
5. DUT1 stop advertising
6. DUT1 set not include Tx power for adv data and scan response
7. DUT1 start advertising
8. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get Tx power in ADV_IND and SCAN_RSP
5. succeed
6. succeed
7. succeed
8. do not have Tx power in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -x 1 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.TxPower="")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.TxPower="")'
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -x 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.TxPower)'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.TxPower)'
- ID: BTSTK_GAP_02003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response adv interval
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 set max interval 0x40 min interval 0x20 for adv data and scan response
3. DUT1 start advertising
4. PC do active scan and capture advertising report
5. DUT1 stop advertising
6. DUT1 set max interval 0x400 min interval 0x200 for adv data and scan response
7. DUT1 start advertising
8. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get interval 0x40 0x20 in ADV_IND and SCAN_RSP
5. succeed
6. succeed
7. succeed
8. get interval 0x400 0x200 in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -i 0x20-0x40 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.SlaveConnIntervalRange="0x0020-0x0040")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.SlaveConnIntervalRange="0x0020-0x0040")'
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -i 0x200-0x400 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.SlaveConnIntervalRange="0x0200-0x0400")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.SlaveConnIntervalRange="0x0200-0x0400")'
- ID: BTSTK_GAP_02004
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response appearance
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 set appearance to 0 for adv data and scan response
3. DUT1 start advertising
4. PC do active scan and capture advertising report
5. DUT1 stop advertising
6. DUT1 set appearance to 1 for adv data and scan response
7. DUT1 start advertising
8. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. do not have appearance in ADV_IND and SCAN_RSP
5. succeed
6. succeed
7. succeed
8. get appearance 1 in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -a 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.Appearance)'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(!HCIEvent.data_0.Appearance)'
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -a 1 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.Appearance="0x01")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.Appearance="0x01")'
- ID: BTSTK_GAP_02005
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response manufacturer data
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 set manufacturer to 0x12345678 for adv data and scan response
3. DUT1 start advertising
4. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get manufacturer data 0x12345678 in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -m 0x12345678 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.ManufacturerSpecificData="0x12345678")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.ManufacturerSpecificData="0x12345678")'
- ID: BTSTK_GAP_02006
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response service data
steps: |
1. DUT1 stop advertise
2. DUT1 set advertising data and scan response service data 0x1234123456 and not include device name
3. DUT1 start advertising
4. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get ServiceData16BitUUID 0x1234123456 in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -n 0 -d 0x1234123456 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.ServiceData16BitUUID="1234123456")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.ServiceData16BitUUID="1234123456")'
- ID: BTSTK_GAP_02007
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP config advertising data
summary: ble set advertising data / scan response service uuid list
steps: |
1. DUT1 stop advertise
2. DUT1 set advertising data and scan response not include name, service uuid list 0xABCD,ABCDDCBA,12349B5F8000008000100000ABCD0000
3. DUT1 start advertising
4. PC do active scan and capture advertising report
expected result: |
1. succeed
2. succeed
3. succeed
4. get Complete16BitServiceUUID 0xABCD Complete32BitServiceUUID 0xABCDDCBA
and Complete128BitServiceUUID 0x12349B5F8000008000100000ABCD0000 in ADV_IND and SCAN_RSP
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v2 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -n 0 -x 0 -i 0x00-0x00 -s ABCD,ABCDDCBA,12349B5F8000008000100000ABCD0000 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.Complete16BitServiceUUID="ABCD")(HCIEvent.data_0.Complete32BitServiceUUID="ABCDDCBA")(HCIEvent.data_0.Complete128BitServiceUUID="12349B5F8000008000100000ABCD0000")'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_RSP")(HCIEvent.address_0=<dut1_bt_mac>)(HCIEvent.data_0.Complete16BitServiceUUID="ABCD")(HCIEvent.data_0.Complete32BitServiceUUID="ABCDDCBA")(HCIEvent.data_0.Complete128BitServiceUUID="12349B5F8000008000100000ABCD0000")'
- ID: BTSTK_GAP_03001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set adv parameter adv_type
steps: |
1. DUT1 stop advertise and set short device name
2. DUT1 start adv with adv_type ADV_IND
3. PC do active scan and capture advertising report
4. repeat step 1-3 with adv_type ADV_TYPE_DIRECT_IND_HIGH
5. repeat step 1-3 with adv_type ADV_TYPE_SCAN_IND
6. repeat step 1-3 with adv_type ADV_TYPE_NONCONN_IND
7. repeat step 1-3 with adv_type ADV_TYPE_DIRECT_IND_LOW
expected result: |
1. succeed
2. succeed
3. get ADV_IND with DUT1 BT MAC
4. get ADV_DIRECT_IND with DUT1 BT MAC
5. get ADV_SCAN_IND with DUT1 BT MAC
6. get ADV_NONCONN_IND with DUT1 BT MAC
7. can not get ADV_DIRECT_IND with DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start -t 0"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- - "SSC SSC1 bleadv -D -z start -t 1 -y 0 -b <hci_nic_mac>"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_DIRECT_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- - "SSC SSC1 bleadv -L -c 0 -i 0x00B0-0x0200 -t 3"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start -t 2 -i 0x00B0-0x0200"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_SCAN_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- - "SSC SSC1 bleadv -D -z start -t 3 -i 0x00B0-0x0200"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_NONCONN_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -i 0x0640-0x0780 -t 3"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start -t 4 -i 0x0640-0x0780 -y 0 -b <hci_nic_mac>"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 3 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.address_0!=<dut1_bt_mac>)'
- ID: BTSTK_GAP_03002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set adv parameter channel map
steps: |
1. DUT1 stop advertise
2. DUT1 start adv on channel 37
3. PC do active scan and capture advertising report
4. repeat step 1-3 with channel map 38, 39, all
4. repeat step 1-3 with channel map not valid
expected result: |
1. succeed
2. succeed
3. get ADV_IND with DUT1 BT MAC
4. get ADV_IND with DUT1 BT MAC
5. can not get ADV_IND with DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - LOOP 6 3 "[1,2,4,7,8,9]" "['=']*4+['!=']*2"
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start -t 0 -h {%d}"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.address_0{%s}<dut1_bt_mac>)'
- ID: BTSTK_GAP_03003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set adv parameter own address type
steps: |
1. DUT1 stop advertise
2. DUT1 start adv with own address type public
3. PC do active scan and capture advertising report
4. repeat step 1-3 with own address type random, rpa_public, rpa_random
5. repeat step 1-3 with channel map not valid
expected result: |
1. succeed
2. succeed
3. get ADV_IND with DUT1 BT MAC
4. get ADV_IND with DUT1 BT MAC
5. can not get ADV_IND with DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - LOOP 4 3 "[0,2,1,3]" "['PDU','PDU','NPDU','NPDU']"
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start -t 0 -o {%d}"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC {%s} (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="ADV_IND")(HCIEvent.data_0.NameComplete=<dut1_ble_name>)(HCIEvent.address_0=<dut1_bt_mac>)'
- ID: BTSTK_GAP_03004
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set adv parameter peer address and peer address type
steps: |
1. DUT1 stop advertise
2. DUT1 start adv with adv type DIRECT_IND_HIGH, peer address type public and peer address as <hci_nic_mac>
3. PC do active scan and capture advertising report
4. repeat step 1-3 with adv type DIRECT_IND_HIGH, peer address type random and peer address as <hci_nic_mac>
expected result: |
1. succeed
2. succeed
3. get ADV_IND with DUT1 name DUT1 BT MAC
4. get ADV_IND with DUT1 name and DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - LOOP 2 2 "[0,1]" "['=','!=']"
- [""]
- - "SSC SSC1 bleadv -D -z start -t 1 -y {%d} -b <hci_nic_mac>"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC PDU (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.address_0{%s}<dut1_bt_mac>)'
- ID: BTSTK_GAP_03005
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set adv parameter adv interval
steps: |
1. DUT1 stop advertise
2. DUT1 start adv with adv interval 0x20-0x20 on channel 1
3. PC do active scan and capture advertising report
4. repeat step 1-3 with adv interval 0x40-0x40, 0x60-0x60
expected result: |
1. succeed
2. succeed
3. calculate adv intervals, within the interval range in adv param
4. calculate adv intervals, within the interval range in adv param
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- "BLEFunction/AdvInterval"
- - interval_list = ["0x0020-0x0020", "0x0040-0x0040", "0x0060-0x0060"]
- ['']
- - deviation = 0.3
- ['']
- ID: BTSTK_GAP_03006
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set paramters for SCAN_IND
steps: |
1. DUT1 stop advertise
2. DUT1 set incorrect adv interval for SCAN_IND
3. PC do active scan and capture advertising report
4. repeat step 1-3 with correct adv interval
expected result: |
1. succeed
2. succeed
3. can not get SCAN_IND with DUT1 BT MAC
4. get SCAN_IND with DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - LOOP 2 2 "['0x20-0x40','0xA0-0xB0']" "['NPDU','PDU']"
- [""]
- - "SSC SSC1 bleadv -D -z start -t 2 -i {%s}"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC {%s} (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="SCAN_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- ID: BTSTK_GAP_03007
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set advertise param
summary: ble set paramters for NONCONN_IND
steps: |
1. DUT1 stop advertise
2. DUT1 set incorrect adv interval for NONCONN_IND
3. PC do active scan and capture advertising report
4. repeat step 1-3 with correct adv interval
expected result: |
1. succeed
2. succeed
3. can not get SCAN_IND with DUT1 BT MAC
4. get SCAN_IND with DUT1 BT MAC
initial condition: BLE_INIT1
test environment: SSC_T1_3
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-03-01)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "NIC BLENIC START <bt_capture_nic> bt+capture"
- ['R PC_COM C +NIC_START:OK']
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - LOOP 2 2 "['0x20-0x40','0xA0-0xB0']" "['NPDU','PDU']"
- [""]
- - "SSC SSC1 bleadv -D -z start -t 3 -i {%s}"
- ["R SSC1 C +BLEADV:OK"]
- - "HCITOOL 2 -i <hci_nic> lescan"
- - 'P PC_COM C +HCITOOL:OK'
- 'P BLENIC {%s} (HCIEvent.le_sub_event_code="LEAdvReport")(HCIEvent.event_type_0="NONCONN_IND")(HCIEvent.address_0=<dut1_bt_mac>)'
- ID: BTSTK_GAP_04001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set scan param
summary: ble set scan type
steps: |
1. stop advertise and set short device name
2. DUT1 set adv data with manufacturer data A
3. DUT1 set scan response data with manufacturer data B
4. DUT2 do passive scan
5. DUT2 do active scan
expected result: |
1. succeed
2. succeed
3. succeed
4. get manufacturer data A
5. get manufacturer data B
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -R -t 1 -r 0x15FF1011121314151617181910111213141516171819"
- ["R SSC1 C +BLEADV:SetAdv,OK"]
- - "SSC SSC1 bleadv -R -t 2 -r 0x020AEB"
- ["R SSC1 C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0 -s 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3 -e 2"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,man,0x1011121314151617181910111213141516171819"%%(<dut1_bt_mac>)'
- 'R SSC2 NRE "\+BTSCANEXT:%%s,txp,0xEB"%%(<dut1_bt_mac>) C Complete'
- - "SSC SSC2 blescan -D -z stop"
- ['R SSC2 C +BLESCAN']
- - "SSC SSC2 blescan -L -c 0 -s 1"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,man,0x1011121314151617181910111213141516171819"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,txp,0xEB"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- ID: BTSTK_GAP_04002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set scan param
summary: ble set scan own address type (not test if own address work as expected)
steps: |
1. DUT1 start advertising
2. DUT2 set own addr type (public, random, rpa_public, rpa_random)
3. DUT2 do active scan
4. DUT2 set invalid own addr type
expected result: |
1. succeed
2. succeed
3. able to scan DUT1
4. error
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - LOOP 4 2 "[0,1,2,3]"
- ['']
- - "SSC SSC2 blescan -L -c 0 -s 1 -o {%d}"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 1"
- ['R SSC2 P <dut1_bt_mac> C Complete']
- - "SSC SSC2 blescan -L -c 0 -o 4"
- ["R SSC2 C +BLESCAN:SetScanParam,ERROR"]
- ID: BTSTK_GAP_04003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set scan param
summary: ble set scan interval (will not test if scan interval work as expected)
steps: |
1. DUT2 start advertising
2. DUT1 set scan interval 0x0004
3. DUT1 set scan interval 0x4000
4. DUT1 set invalid scan interval
expected result: |
1. succeed
2. succeed
3. succeed
4. error
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC2 bleadv -D -z start"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 blescan -L -c 0 -s 1 -i 0x0004"
- ["R SSC1 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC1 blescan -L -c 0 -s 1 -i 0x4000"
- ["R SSC1 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC1 blescan -L -c 0 -s 1 -i 0x0003"
- ["R SSC1 C +BLESCAN:SetScanParam,ERROR"]
- - "SSC SSC1 blescan -L -c 0 -s 1 -i 0x4001"
- ["R SSC1 C +BLESCAN:SetScanParam,ERROR"]
- ID: BTSTK_GAP_04004
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP set scan param
summary: ble set scan window (will not test if scan window work as excepted)
steps: |
1. DUT2 set scan interval 0x0004
2. DUT2 set scan interval 0x4000
3. DUT2 set scan interval 0x0003
4. DUT2 set scan interval 0x4001
expected result: |
1. succeed
2. succeed
3. fail
4. fail
initial condition: BLE_INIT1
test environment: SSC_T1_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 blescan -L -c 0 -w 0x0004"
- ["R SSC1 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC1 blescan -L -c 0 -w 0x4000"
- ["R SSC1 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC1 blescan -L -c 0 -w 0x0003"
- ["R SSC1 C +BLESCAN:SetScanParam,ERROR"]
- - "SSC SSC1 blescan -L -c 0 -w 0x4001"
- ["R SSC1 C +BLESCAN:SetScanParam,ERROR"]
- ID: BTSTK_GAP_05001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP start stop adv / scan
summary: stop and start adv in wrong state
steps: |
1. DUT1 stop adv
2. DUT1 stop adv
3. DUT2 do passive scan
4. DUT1 start adv
5. DUT1 start adv
6. DUT2 do passive scan
expected result: |
1. succeed
2. succeed
3. DUT1 not in scan result
4. succeed
5. succeed
6. DUT1 in scan result
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 1"
- ["R SSC2 NP <dut1_bt_mac> C Complete"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 1"
- ["R SSC2 P <dut1_bt_mac> C Complete"]
- ID: BTSTK_GAP_05002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP start stop adv / scan
summary: cancel scan when scanning or not scanning
steps: |
1. DUT1 start scanning for 3 seconds
2. DUT1 stop scanning
3. DUT1 stop scanning
expected result: |
1. succeed
2. succeed
3. succeed
initial condition: BLE_INIT1
test environment: SSC_T1_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 blescan -L -c 0"
- ["R SSC1 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC1 blescan -D -z start -t 3"
- ["R SSC1 C +BLESCAN:OK"]
- - "SSC SSC1 blescan -D -z stop"
- ["R SSC1 C +BLESCAN:OK"]
- - "SSC SSC1 blescan -D -z stop"
- ["R SSC1 C +BLESCAN:OK"]
- ID: BTSTK_GAP_06001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP connect / disconnect
summary: ble connect as "client" and "server"
steps: |
1. DUT1 connect to DUT2 as "client"
2. DUT1 disconnected with DUT2
3. DUT1 start gatt server app
4. DUT1 connect to DUT2 as "server"
expected result: |
1. succeed
2. succeed
3. succeed
4. succeed
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcConnect,OK']
- - "SSC SSC1 bleconn -D -p 0x10"
- ['R SSC1 C +BLE:CLOSE,OK']
- - "SSC SSC1 gatts -S -z load -p 0xA0"
- ['R SSC1 C +GATTS:LoadProfile,OK']
- - "SSC SSC2 bleadv -D -z start"
- ['R SSC2 C +BLEADV:OK']
- - "SSC SSC1 bleconn -C -p 0xA0 -a <dut2_bt_mac> -z server"
- ['R SSC1 C +BLE:GattsConnect']
- ID: BTSTK_GAP_06002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP connect / disconnect
summary: ble disconnect as "client" and "server"
steps: |
1. DUT1 connect to DUT2 as "client"
2. DUT1 disconnected with DUT2 as "client"
3. DUT1 start gatt server app
4. DUT1 connect to DUT2 as client
5. DUT1 disconnect with DUT2 as "server"
expected result: |
1. succeed
2. succeed
3. succeed
4. succeed
5. succeed
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcConnect,OK']
- - "SSC SSC1 bleconn -D -p 0x10"
- ['R SSC1 C +BLE:CLOSE,OK']
- - "SSC SSC2 bleadv -D -z start"
- ['R SSC2 C +BLEADV:OK']
- - "SSC SSC1 gatts -S -z load -p 0xA0"
- ['R SSC1 C +GATTS:LoadProfile,OK']
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcConnect,OK']
- - "SSC SSC1 bleconn -D -p 0x10"
- ['R SSC1 C +BLE:CLOSE,OK']
- ID: BTSTK_GAP_06003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP connect / disconnect
summary: ble connect/disconnect to same connection multiple times
steps: |
1. DUT1 connect to DUT2 as "client"
2. DUT1 start gatt server app
3. DUT1 connect to DUT2 as "client" again
4. DUT1 connect to DUT2 as "server"
5. DUT1 disconnected with DUT2 as "client"
6. DUT1 disconnected with DUT2 as "server"
expected result: |
1. succeed
2. succeed
3. succeed
4. succeed
5. succeed
6. succeed
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcConnect,OK']
- - "SSC SSC1 gatts -S -z load -p 0xA0"
- ['R SSC1 C +GATTS:LoadProfile,OK']
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcOpen,OK']
- - "SSC SSC1 bleconn -C -p 0xA0 -a <dut2_bt_mac> -z server"
- ['R SSC1 C +BLE:GattsConnect']
- - "SSC SSC1 bleconn -D -p 0x10"
- ['R SSC1 C +BLE:CLOSE,OK']
- - "SSC SSC1 bleconn -D -p 0xA0 -z server"
- ['R SSC1 RE +BLE:GattsClose,OK']
- ID: BTSTK_GAP_06004
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP connect / disconnect
summary: ble connect to invalid address
steps: |
1. DUT1 connect to invalid address
2. DUT1 connect to DUT2
expected result: |
1. failed
2. succeed
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -C -p 0x10 -a 24:0a:c4:04:26:50"
- ['R SSC1 C +BLECONN:OK']
- - DELAY 30
- ['R SSC1 C +BLE:GattcOpen,ERROR']
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['R SSC1 C +BLE:GattcConnect,OK']
- ID: BTSTK_GAP_06005
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP connect / disconnect
summary: ble connect/disconnect event to active app
steps: |
1. DUT1, DUT2 create gatts app
2. DUT1 connect to DUT2 as "client"
3. DUT1 do disconnect as "server"
expected result: |
1. succeed
2. succeed, DUT1 and DUT2 gatts get connect event
3. DUT1 and DUT2 gatts get disconnect event
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC[1-2] gatts -S -z load -p 0xA0"
- ['R SSC[1-2] C +GATTS:LoadProfile,OK']
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['P SSC1 C +BLE:GattcConnect C +BLE:GattsConnect', 'P SSC2 C +BLE:GattsConnect']
- - "SSC SSC1 bleconn -D -p 0xA0 -z server"
- ['P SSC1 C +BLE:GattsClose']
- ID: BTSTK_GAP_07001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP update connect parameters
summary: update connect parameters by master
steps: |
1. DUT1 update connection parameters
expected result: |
1. succeed
initial condition: BLE_CONN2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -S -z ConnParam -a <dut2_bt_mac>"
- ['R SSC1 C +BLECONN:OK']
- ID: BTSTK_GAP_07002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP update connect parameters
summary: update connect parameters by slave
steps: |
1. DUT2 update connection parameters
expected result: |
1. succeed
initial condition: BLE_CONN2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC2 bleconn -S -z ConnParam -a <dut1_bt_mac>"
- ['R SSC2 C +BLECONN:OK']
- ID: BTSTK_GAP_07003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP update connect parameters
summary: update invalid connect parameters
steps: |
1. DUT1 update invalid interval
2. DUT1 update invalid latency
3. DUT1 update invalid timeout
expected result: |
1. fail
2. fail
3. fail
initial condition: BLE_CONN2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleconn -S -z ConnParam -a <dut2_bt_mac> -i 0-0xFFFF"
- ['R SSC1 C +BLECONN:ERROR']
- - "SSC SSC1 bleconn -S -z ConnParam -a <dut2_bt_mac> -l 0x1F4"
- ['R SSC1 C +BLECONN:ERROR']
- - "SSC SSC1 bleconn -S -z ConnParam -a <dut2_bt_mac> -t 0x08"
- ['R SSC1 C +BLECONN:ERROR']
- - "SSC SSC1 bleconn -S -z ConnParam -a <dut2_bt_mac> -t 0xC81"
- ['R SSC1 C +BLECONN:ERROR']
- ID: BTSTK_GAP_08001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP operation without init/enable BT or register callback
summary: do adv, scan, set name when BT is deinit
steps: |
1. DUT1 do adv
2. DUT1 do scan
3. DUT2 do set name
expected result: |
1. fail
2. fail
3. fail
initial condition: BLE_DEINIT1
test environment: SSC_T1_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -L -c 0"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 blescan -L -c 0"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 blescan -D -z start"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 ble -S -z name -n abcde"
- ["R SSC1 C +BLE"]
- ID: BTSTK_GAP_08002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP operation without init/enable BT or register callback
summary: do adv, scan, set name, conn when BT is disable
steps: |
1. DUT1 do init
2. DUT1 do adv
3. DUT1 do scan
4. DUT2 do set name
expected result: |
1. succeed
2. fail
3. fail
4. fail
initial condition: BLE_DEINIT1
test environment: SSC_T1_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bt -D -z init"
- ["R SSC1 C +BT:OK"]
- - "SSC SSC1 bleadv -L -c 0"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 blescan -L -c 0"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 blescan -D -z start"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 ble -S -z name -n abcde"
- ["R SSC1 C +BLE"]
- ID: BTSTK_GAP_08003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP operation without init/enable BT or register callback
summary: do adv, scan, set name, conn when BT is enable but no callback registered
steps: |
1. DUT1 do init and enable
2. DUT1 do adv
3. DUT1 do scan
4. DUT2 do set name
expected result: |
1. succeed
2. fail
3. fail
4. fail
initial condition: BLE_DEINIT1
test environment: SSC_T1_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bt -D -z start"
- ["R SSC1 C +BT:OK"]
- - "SSC SSC1 bleadv -L -c 0"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 blescan -L -c 0"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 blescan -D -z start"
- ["R SSC1 C +BLESCAN"]
- - "SSC SSC1 ble -S -z name -n abcde"
- ["R SSC1 C +BLE"]
- ID: BTSTK_GAP_09001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP processing scan data
summary: process scan data txp, manufacturer data, interval range, appearence, flag
steps: |
1. DUT1 set raw adv data tx power, manufacturer data, interval range, apperaence, flag
2. DUT1 start adv
3. DUT2 do active scan with extended scan data 19
expected result: |
1. succeed
2. succeed
3. scan with the correct adv data
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -R -t 1 -r 0x020AEB06FF1112131415051220004000021901020106"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -D -z start -t 1 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,man,0x1112131415"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,txp,0xEB"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,intrange,0x20004000"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,app,0x01"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,flag,0x06"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- ID: BTSTK_GAP_09002
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP processing scan data
summary: process scan data service UUIDs
steps: |
1. DUT1 set raw adv 16 bit Complete UUID list
2. DUT1 start adv
3. DUT2 do active scan with extended scan data
4. repeat step 1-3 with 16 bit incomplete UUID, 32 bit complete/incomplete UUID, 128 bit complete/incomplete UUID
expected result: |
1. succeed
2. succeed
3. scan with the correct adv data
4. scan with the correct adv data
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - LOOP 4 3 "['0302ABCD','0303ABCD','0504ABCDABCD','0505ABCDABCD',]" "['insrv16,0xABCD','srv16,0xABCD','insrv32,0xABCDABCD','srv32,0xABCDABCD']"
- - "SSC SSC1 bleadv -R -t 1 -r 0x{%s}"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 blescan -D -z start -t 1 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,{%s}"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- - LOOP 2 3 "['1106ABCDABCDABCDABCDABCDABCDABCDABCD','1107ABCDABCDABCDABCDABCDABCDABCDABCD']" "['insrv128,0xABCDABCDABCDABCDABCDABCDABCDABCD','srv128,0xABCDABCDABCDABCDABCDABCDABCDABCD']"
- - "SSC SSC1 bleadv -R -t 1 -r 0x{%s}"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 blescan -D -z start -t 1 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,{%s}"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- ID: BTSTK_GAP_09003
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP processing scan data
summary: process scan data service data
steps: |
1. DUT1 set raw adv 16 bit service data
2. DUT1 start adv
3. DUT2 do active scan with extended scan data
4. repeat step 1-3 with 32 bit service data, 128 bit service data
expected result: |
1. succeed
2. succeed
3. scan with the correct adv data
4. scan with the correct adv data
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - LOOP 3 3 "['0416ABCDEF','0620ABCDABCDEF','1221ABCDABCDABCDABCDABCDABCDABCDABCDEF',]" "['srvdata,0xABCDEF','srvdata32,0xABCDABCDEF','srvdata128,0xABCDABCDABCDABCDABCDABCDABCDABCDEF']"
- - "SSC SSC1 bleadv -R -t 1 -r 0x{%s}"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 blescan -D -z start -t 1 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,{%s}"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- ID: BTSTK_GAP_09004
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'Yes'
category: Function
test point 1: basic function
test point 2: BLE GAP processing scan data
summary: process combined adv data and scan response data
steps: |
1. DUT1 set raw adv data manufacturer data
2. DUT1 set scan response data tx power, interval range, apperaence, flag
2. DUT1 start adv
3. DUT2 do active scan with extended scan data 19
expected result: |
1. succeed
2. succeed
3. scan with the correct adv data
initial condition: BLE_INIT2
test environment: SSC_T2_1
execution time: 0
module: BT Stack
sub module: GAP
version: v1 (2016-12-31)
CI ready: 'Yes'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -R -t 1 -r 0x15FF1011121314151617181910111213141516171819"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -R -t 2 -r 0x020AEB051220004000021901020106"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -D -z start -t 1 -e 1"
- - 'P SSC2 RE "\+BTSCANEXT:%%s,man,0x1011121314151617181910111213141516171819"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,txp,0xEB"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,intrange,0x20004000"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,app,0x01"%%(<dut1_bt_mac>)'
- 'P SSC2 RE "\+BTSCANEXT:%%s,flag,0x06"%%(<dut1_bt_mac>)'
- 'R SSC2 C Complete'
- ID: BTSTK_GAP_40001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'No'
category: Function
test point 1: function
test point 2: test if BLE work after switch off some sub modules
summary: GAP only test
steps: |
1. download GAP only SSC bin on both DUT
2. DUT1 set ascii device name
3. stop advertising
4. config scan response and start advertising
5. DUT2 do active scan
expected result: |
1. succeed
2. succeed
3. succeed
4. succeed
5. device name in scan result
initial condition: None
test environment: SSC_T2_1
execution time: 5
module: BT Stack
sub module: GAP
version: v1 (2017-05-19)
CI ready: 'No'
level: Integration
allow fail: ''
cmd set:
- ""
- - "SSC SSC[1-2] reboot"
- ['R SSC[1-2] C !!!ready!!!']
- - "SSC SSC[1-2] ble -R"
- ["R SSC[1-2] C +BLE:OK"]
- - "SSC SSC1 ble -S -z name -n <dut1_ble_name>"
- ["R SSC1 C +BLE:OK"]
- - "SSC SSC1 bleadv -D -z stop"
- ["R SSC1 C +BLEADV"]
- - "SSC SSC1 bleadv -L -c 0 -t 3"
- ["R SSC1 C +BLEADV:SetAdv,OK C +BLEADV:SetScanRes,OK"]
- - "SSC SSC1 bleadv -D -z start"
- ["R SSC1 C +BLEADV:OK"]
- - "SSC SSC2 bleadv -D -z stop"
- ["R SSC2 C +BLEADV:OK"]
- - "SSC SSC2 blescan -L -c 0"
- ["R SSC2 C +BLESCAN:SetScanParam,OK"]
- - "SSC SSC2 blescan -D -z start -t 3"
- ["R SSC2 P <dut1_ble_name>"]
- ID: BTSTK_GAP_50001
SDK: ESP32_IDF
Test App: SSC_BLE
auto test: 'No'
category: Stress
test point 1: stress
test point 2: BLE GAP stress test
summary: BLE Connect and disconnect stress test
steps: |
1. DUT1 disconnect with DUT2
2. DUT2 start advertising
3. DUT1 connect to DUT2
4. do service discovery
5. loop step 1-4
expected result: |
1. succeed
2. succeed
3. succeed
4. succeed
5. succeed
initial condition: BLE_CONN2
test environment: SSC_T2_1
execution time: 5
module: BT Stack
sub module: GAP
version: v1 (2017-05-19)
CI ready: 'No'
level: Integration
allow fail: ''
cmd set:
- ""
- - "LOOP 1000 5"
- ['']
- - "SSC SSC1 ram"
- ['R SSC1 A <heap_size>:(\d+)']
- - "SSC SSC1 bleconn -D -z all"
- ['P SSC1 C +BLE:CLOSE', 'P SSC2 C +BLE:GattsDisconnect']
- - "SSC SSC2 bleadv -D -z start"
- ['R SSC2 C +BLEADV:OK']
- - "SSC SSC1 bleconn -C -p 0x10 -a <dut2_bt_mac>"
- ['P SSC1 C +BLE:GattcConnect,OK', 'P SSC2 C +BLE:GattsConnect']
- - "SSC SSC1 gattc -D -z primaryService -p 0x10"
- ["R SSC1 C +GATTC:DiscoverService,A000"]
Reference in New Issue View Git Blame Copy Permalink