alex/esp-idf
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esp-idf/components/idf_test/include
History
wanlei 2baee4fb0f refactor(spi_master): replace dma_ll in spi hal layer (part 2.1)
2023-12-28 19:58:54 +08:00
..
esp32 feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00
esp32c2 refactor(spi_master): replace dma_ll in spi hal layer (part 2.1) 2023-12-28 19:58:54 +08:00
esp32c3 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
esp32c5 feat(esp32c5): introduce target esp32c5 2023-11-28 16:14:17 +08:00
esp32c6 feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00
esp32h2 refactor(spi_master): replace dma_ll in spi hal layer (part 2.1) 2023-12-28 19:58:54 +08:00
esp32p4 feat(spi_master): p4 add master driver supported 2023-10-08 14:45:12 +08:00
esp32s2 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
esp32s3 spi: add high freq test on different spi config 2023-02-27 11:27:57 +08:00
idf_performance.h feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00