esp-idf/components/driver/test
Wan Lei c5b094a96f Merge branch 'test/fix_sio_mode_multi_test_faile' into 'master'
spi_master: in unit test modify communication bringup flow to fix spi sio mode test failure

See merge request espressif/esp-idf!19712
2022-08-25 16:33:10 +08:00
..
dac_dma_test esp_adc: new esp_adc component and adc drivers 2022-07-15 18:31:00 +08:00
include/test esp_adc: new esp_adc component and adc drivers 2022-07-15 18:31:00 +08:00
param_test driver: update copyright notice 2021-05-24 01:06:17 +02:00
CMakeLists.txt touch_sensor: move unit tests to test_app 2022-08-08 19:12:56 +08:00
test_common_spi.c spi: support spi on h2 2022-03-29 11:54:08 +08:00
test_dac.c esp_adc: new esp_adc component and adc drivers 2022-07-15 18:31:00 +08:00
test_i2c.c i2c: support i2c on esp32h2 2022-04-23 07:38:25 +00:00
test_ledc.c ledc: Fix the usage of ledc_ls_timer_update and ledc_timer_rst 2022-08-19 19:07:46 +08:00
test_rs485.c driver: uart rs485 fix test sync issues and fail threshold 2022-08-16 13:10:13 +08:00
test_rtcio.c freertos: Remove legacy data types 2022-02-09 23:05:45 +08:00
test_sdio.c global: add dependency on esp_timer component and include esp_timer.h 2022-04-25 18:39:23 +02:00
test_sdmmc_sdspi_init.cpp remove: sdspi_host deprecated api 2022-06-12 20:07:27 +00:00
test_spi_bus_lock.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_master.c hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces 2022-07-22 00:06:06 +08:00
test_spi_param.c test_spi: fixed redundant quotes in test descriptions 2022-07-20 15:36:10 +08:00
test_spi_sio.c spi_master: change sio test communication bringup flow to fix testcase failure 2022-08-24 14:20:26 +08:00
test_spi_slave_hd.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_slave.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_uart.c uart: Add a new API to get the free space size of tx buffer 2022-07-05 18:39:22 +08:00