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dac_dma_test
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esp_adc: new esp_adc component and adc drivers
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2022-07-15 18:31:00 +08:00 |
include/test
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esp_adc: new esp_adc component and adc drivers
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2022-07-15 18:31:00 +08:00 |
param_test
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driver: update copyright notice
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2021-05-24 01:06:17 +02:00 |
CMakeLists.txt
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touch_sensor: move unit tests to test_app
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2022-08-08 19:12:56 +08:00 |
test_common_spi.c
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spi: support spi on h2
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2022-03-29 11:54:08 +08:00 |
test_dac.c
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esp_adc: new esp_adc component and adc drivers
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2022-07-15 18:31:00 +08:00 |
test_i2c.c
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i2c: support i2c on esp32h2
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2022-04-23 07:38:25 +00:00 |
test_ledc.c
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ledc: Fix the usage of ledc_ls_timer_update and ledc_timer_rst
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2022-08-19 19:07:46 +08:00 |
test_rs485.c
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driver: uart rs485 fix test sync issues and fail threshold
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2022-08-16 13:10:13 +08:00 |
test_rtcio.c
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freertos: Remove legacy data types
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2022-02-09 23:05:45 +08:00 |
test_sdio.c
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global: add dependency on esp_timer component and include esp_timer.h
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2022-04-25 18:39:23 +02:00 |
test_sdmmc_sdspi_init.cpp
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remove: sdspi_host deprecated api
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2022-06-12 20:07:27 +00:00 |
test_spi_bus_lock.c
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ci: partially enable ut tests for esp32c2
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2022-06-02 14:23:35 +08:00 |
test_spi_master.c
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hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces
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2022-07-22 00:06:06 +08:00 |
test_spi_param.c
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test_spi: fixed redundant quotes in test descriptions
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2022-07-20 15:36:10 +08:00 |
test_spi_sio.c
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spi_master: change sio test communication bringup flow to fix testcase failure
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2022-08-24 14:20:26 +08:00 |
test_spi_slave_hd.c
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ci: partially enable ut tests for esp32c2
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2022-06-02 14:23:35 +08:00 |
test_spi_slave.c
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ci: partially enable ut tests for esp32c2
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2022-06-02 14:23:35 +08:00 |
test_uart.c
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uart: Add a new API to get the free space size of tx buffer
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2022-07-05 18:39:22 +08:00 |