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esp-idf/components/fatfs/test_apps
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Kevin (Lao Kaiyao) 432864e917 Merge branch 'ci/enable_c5_mp_ci_jobs' into 'master' 
ci(esp32c5mp): enable esp32c5 build on CI

See merge request espressif/esp-idf!29895
2024-04-08 12:16:16 +08:00
..
flash_ro Merge branch 'ci/enable_c5_mp_ci_jobs' into 'master' 2024-04-08 12:16:16 +08:00
flash_wl Merge branch 'ci/enable_c5_mp_ci_jobs' into 'master' 2024-04-08 12:16:16 +08:00
sdcard fix(sdspi): temp skip run high falure job on esp32 2024-03-15 16:15:55 +08:00
test_fatfs_common fix(storage): applied spelling fixes by codespell pre-commit hook 2024-03-28 13:00:54 +01:00
.build-test-rules.yml ci(esp32c5mp): disable the unsupported tests 2024-04-07 12:13:29 +08:00
README.md fatfs: add missing readme file for the test apps 2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

  • sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
  • flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
  • flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

  • test functions
  • setup/teardown routines
  • build/test configurations
  • pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.