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analog_comparator
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fix(test): check call graph for hal component
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2023-07-05 09:09:01 +08:00 |
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components
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spi_slave: add multi board test case for spi slave hd append mode
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2023-03-21 11:30:17 +08:00 |
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dac_test_apps
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fix(test): check call graph for hal component
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2023-07-05 09:09:01 +08:00 |
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gpio
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feat(lp_io): Add support for ESP32P4
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2023-09-20 19:39:41 +08:00 |
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gpio_extensions
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ci: add pd_vddsdio in lightsleep UT tests
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2023-07-14 21:21:23 +08:00 |
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gptimer
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feat(mcpwm): Set group clock prescale dynamically
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2023-09-08 11:57:29 +08:00 |
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i2c_test_apps
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fix(i2c_master): Fix I2C new master cannot continously probe
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2023-09-05 12:27:18 +08:00 |
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i2s_test_apps
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ci(i2s): add external clock input multi_dev test cases
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2023-08-14 03:25:12 +00:00 |
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ledc
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fix(ledc): fix frequency calculation
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2023-07-10 11:45:09 +08:00 |
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legacy_adc_driver
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Merge branch 'feature/cleanup_wrong_log_use' into 'master'
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2023-06-15 21:49:49 +08:00 |
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legacy_i2c_driver
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fix(test_apps): Trim builds of component test apps
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2023-09-18 17:16:37 +08:00 |
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legacy_mcpwm_driver
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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legacy_pcnt_driver
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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legacy_rmt_driver
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feat(rmt): add driver support for esp32p4
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2023-09-19 12:54:14 +08:00 |
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legacy_rtc_temp_driver
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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legacy_timer_driver
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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mcpwm
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feat(mcpwm): Set group clock prescale dynamically
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2023-09-08 11:57:29 +08:00 |
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parlio
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feat(esp_gdma): add hal interface for common operations
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2023-07-10 13:45:57 +08:00 |
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pulse_cnt
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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rmt
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fix(intr): always allocate memory from internal ram
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2023-09-22 15:13:35 +08:00 |
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rs485
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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sdio
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Merge branch 'feature/cleanup_wrong_log_use' into 'master'
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2023-06-15 21:49:49 +08:00 |
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spi
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refactor(intr): add namespace for intr_cpu_id_t
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2023-09-06 09:50:41 +08:00 |
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temperature_sensor
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feat(temperature_sensor_test): Add test for temperature sensor and phy
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2023-07-07 10:15:07 +08:00 |
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touch_sensor_v1
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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touch_sensor_v2
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Merge branch 'feature/cleanup_wrong_log_use' into 'master'
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2023-06-15 21:49:49 +08:00 |
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twai
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fix(test): check call graph for hal component
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2023-07-05 09:09:01 +08:00 |
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uart
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feat(uart): Add sdkconfig.ci.iram_safe test for UART driver
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2023-08-30 11:30:03 +08:00 |
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.build-test-rules.yml
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fix(ci): change build-test-rules files folder
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2023-09-20 19:17:06 +08:00 |
