esp-idf/components/driver/test
Michael (XIAO Xufeng) f8f2f7c297 Merge branch 'bugfix/touch_sensor_denoise_ci_for_esp32s2' into 'master'
ut: fix touch sensor denoise ci fail

Closes IDFCI-46

See merge request espressif/esp-idf!9571
2020-07-14 11:04:06 +08:00
..
adc_dma_test driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
dac_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
include/test spi_slave_hd: new driver for spi slave in half duplex mode 2020-07-11 00:00:50 +08:00
param_test driver: Rename "local" tests to "single board" tests, add some description to the names 2019-12-12 11:05:04 +11:00
touch_sensor_test ut: fix touch sensor denoise ci fail 2020-07-10 15:10:18 +08:00
CMakeLists.txt driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
component.mk driver(adc): fix adc io init bug; add unit test to check; 2020-05-12 06:52:26 +00:00
test_adc2_with_wifi.c driver(adc/dac): fix adc dac driver for esp32s2 2020-04-01 12:41:51 +08:00
test_adc_common.c driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
test_common_spi.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_dac.c driver(adc): add adc initial code before app_main for esp32s2. 2020-04-04 10:15:30 +08:00
test_gpio.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_i2c.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_i2s.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_ledc.c ci: disable case witout runners 2020-02-15 18:28:25 +08:00
test_pcnt.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_pwm.c ut: Move tests back from "esp32" subfolder 2020-01-06 17:13:53 +08:00
test_rmt.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_rs485.c ci: temporarily disable RS485 related tests 2020-07-06 20:12:43 +00:00
test_rtcio.c rtcio: add hal for driver 2019-11-21 10:40:49 +08:00
test_sdio.c sdio: fix the unit of performance test 2020-05-12 12:25:46 +08:00
test_sdmmc_sdspi_init.cpp sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards 2020-02-12 15:16:08 +08:00
test_sigmadelta.c test: driver/sigmadelta test case 2018-06-13 10:15:06 +08:00
test_spi_bus_lock.c spi: fix config break and reduce overhead of the bus lock on SPI1 2020-04-22 16:06:13 +08:00
test_spi_master.c spi: allow force pins being configured throug GPIO matrix 2020-07-11 00:00:47 +08:00
test_spi_param.c spi: add unit test for slave receiving length 2020-03-11 13:24:30 +08:00
test_spi_sio.c global: rename esp32s2beta to esp32s2 2020-01-22 12:14:38 +08:00
test_spi_slave_hd.c spi_slave_hd: new driver for spi slave in half duplex mode 2020-07-11 00:00:50 +08:00
test_spi_slave.c esp_rom: extract common GPIO apis into esp_rom_gpio.h 2020-07-07 11:40:19 +08:00
test_timer.c bugfix(timer): improve timer unit test case 2020-06-15 16:12:51 +08:00
test_uart.c driver test: Ensure uart write task can't overflow buffer of read task 2020-07-08 16:49:06 +10:00