laokaiyao b9e44b92b3 ci(i2s): enable i2s ci tests on p4

2024-01-19 19:28:33 +08:00

..

components

feat(sdio): sdio cross chip test app

2023-11-13 11:21:47 +08:00

dac_test_apps/legacy_dac_driver

refactor(dac): make dac driver as component

2023-11-23 12:04:06 +08:00

i2s_test_apps

ci(i2s): enable i2s ci tests on p4

2024-01-19 19:28:33 +08:00

legacy_adc_driver

fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12

2023-11-06 18:55:49 +08:00

legacy_i2c_driver

fix(i2c): test app change gpio

2024-01-11 21:44:30 +08:00

legacy_mcpwm_driver

fix(mcpwm): enable mcpwm group clock before hal init

2024-01-15 18:13:56 +08:00

legacy_pcnt_driver

change(pcnt): reenable the target test for esp32p4

2024-01-10 23:03:40 +08:00

legacy_rmt_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_rtc_temp_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_sigma_delta_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_timer_driver

ci(p4): added todo jira for disabled tests on p4

2024-01-04 09:36:38 +08:00

touch_sensor_v1

driver:Trim the build components

2023-06-13 14:24:44 +08:00

touch_sensor_v2

fix(uart,usj...): Fix wrong serial number that has been parsed to rom functions,

2024-01-18 10:51:51 +08:00

twai

fix(twai): enable twai interactive test for all targets on new std runner

2024-01-05 15:22:09 +08:00

.build-test-rules.yml

feat(i2s): support i2s legacy driver on p4

2024-01-19 19:28:33 +08:00