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esp-idf/components/fatfs/test_apps
History
Adam Múdry 976644acf6 CI: fix sdcard fatfs test_apps format timeout
2023-05-25 08:52:59 +00:00
..
flash_ro esp32h2: add build test 2023-01-17 10:29:04 +08:00
flash_wl CI: sdcard tests fail fix 2023-05-10 16:48:03 +02:00
sdcard CI: fix sdcard fatfs test_apps format timeout 2023-05-25 08:52:59 +00:00
test_fatfs_common bugfix: fix for fatfs "open("xx",O_CREAT|O_WRONLY,0666)" call failure 2023-04-18 09:57:44 +05:30
README.md fatfs: add missing readme file for the test apps 2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

  • sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
  • flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
  • flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

  • test functions
  • setup/teardown routines
  • build/test configurations
  • pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.