alex/esp-idf
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Code Issues Actions 2 Packages Projects Releases Wiki Activity
c331c85318
esp-idf/components/fatfs
History
Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout 
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
diskio Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
port Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
src fatfs: Fix some memory leak issues by coverity static analyzer. 2021-01-25 03:37:47 +00:00
test vfs/fatfs: fix failed tests by increasing timeout 2021-08-25 19:04:34 +08:00
test_fatfs_host host tests: add missing header files for compiling host tests 2021-07-20 17:44:20 +08:00
vfs fatfs: Fix some memory leak issues by coverity static analyzer. 2021-01-25 03:37:47 +00:00
CMakeLists.txt sdspi: support crc16_be for esp32s2 2020-02-12 15:15:46 +08:00
component.mk fatfs: create separate ffsystem.c for host side testing 2019-06-25 23:07:07 +08:00
Kconfig docs: added some fast-seek documentation to the fatfs.rst 2020-11-06 13:18:16 -03:00