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analog_comparator
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feat(ana_cmpr): supported etm in analog comparator example
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2023-09-25 19:57:34 +08:00 |
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components
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feat(spi_master): p4 enable test and examples
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2023-10-08 14:45:52 +08:00 |
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dac_test_apps
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fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12
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2023-11-07 14:11:10 +08:00 |
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gpio
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feat(lp_io): Add support for ESP32P4
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2023-09-20 19:39:41 +08:00 |
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gpio_extensions
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ci: add pd_vddsdio in lightsleep UT tests
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2023-07-14 21:21:23 +08:00 |
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gptimer
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feat(mcpwm): Set group clock prescale dynamically
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2023-09-08 11:57:29 +08:00 |
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i2c_test_apps
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feat(i2c_test): Add multi board test for I2C master and I2C slave
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2023-10-24 18:46:27 +08:00 |
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i2s_test_apps
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fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12
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2023-11-07 14:11:10 +08:00 |
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ledc
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feat(ledc): support ledc on esp32p4
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2023-10-17 16:40:04 +08:00 |
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legacy_adc_driver
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Merge branch 'feature/support_adc_calibration_on_h2_v5.2' into 'release/v5.2'
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2023-11-09 12:14:40 +08:00 |
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legacy_i2c_driver
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fix(i2c): test app change gpio
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2024-01-16 11:10:36 +08:00 |
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legacy_mcpwm_driver
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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legacy_pcnt_driver
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feat(ledc): support ledc on esp32p4
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2023-10-17 16:40:04 +08:00 |
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legacy_rmt_driver
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feat(rmt): add driver support for esp32p4
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2023-09-19 12:54:14 +08:00 |
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legacy_rtc_temp_driver
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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legacy_timer_driver
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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mcpwm
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fix(mcpwm): fault trigger test forget connect timer and operator
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2023-11-17 16:34:40 +08:00 |
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parlio
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feat(parlio_tx): supported parlio tx on p4
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2023-09-25 10:42:30 +08:00 |
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pulse_cnt
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feat(ci): Enable p4 example, test_apps and unit tests CI build
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2023-08-24 12:51:19 +08:00 |
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rmt
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feat(rmt): support calling rmt_receive in ISR callback
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2023-11-08 14:32:26 +08:00 |
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rs485
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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sdio
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Merge branch 'feature/cleanup_wrong_log_use' into 'master'
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2023-06-15 21:49:49 +08:00 |
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spi
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feat(spi_master): p4 enable test and examples
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2023-10-08 14:45:52 +08:00 |
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temperature_sensor
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feat(temperature_sensor_test): Add test for temperature sensor and phy
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2023-07-07 10:15:07 +08:00 |
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touch_sensor_v1
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driver:Trim the build components
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2023-06-13 14:24:44 +08:00 |
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touch_sensor_v2
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Merge branch 'feature/cleanup_wrong_log_use' into 'master'
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2023-06-15 21:49:49 +08:00 |
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twai
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feat(twai): support multiple twai controllers
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2023-10-12 09:59:27 +08:00 |
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uart
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feat(uart): uart(hp,lp) support on esp32p4
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2023-10-08 10:10:00 +08:00 |
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usb_serial_jtag
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feat(usb_serial_jtag): Add pytest for usb_serial_jtag
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2023-10-10 10:05:46 +08:00 |
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.build-test-rules.yml
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Merge branch 'bugfix/compile_usj_fail_c6' into 'master'
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2023-10-10 13:47:19 +08:00 |
